SEMI International Standards
Standards Locale: Japan
Committee: FPD - Materials & Components
Place of Meeting: SEMI Japan, Tokyo
Date of Meeting: 09/06/2019
Meeting End Date: 09/06/2019
Recording SEMI Standards Staff: Chie Yanagisawa
CER Posted to Web: 10/03/2019


Leadership Changes

WG/TF/SC/TC Name
Previous Leader
New Leader
FPD Color Filter Task ForceTadahiro Furukawa (Yamagata University) Not applicable due to the TF’s discharge


Committee Structure Changes

Previous WG/TF/SC Name
New WG/TF/SC Name or Status Change
FPD Color Filter Task ForceThe task force was discharged.


Ballot Results
None.

Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities

#
Type
SC/TF/WG
Details
6584SNARFFPD Mask TFNew SNARF for Reapproval to SEMI D20-0706 (Reapproved 0815): “Terminology for FPD Mask Defect”
6585SNARFFPD Mask TFNew SNARF for Reapproval to SEMI D21-0706 (Reapproved 0815): “Terminology for FPD Mask Pattern Accuracy”
Note 1: SNARFs and TFOFs are available for review on the SEMI Web site at:

http://downloads.semi.org/web/wstdsbal.nsf/TFOFSNARF

Authorized Ballots
None.

SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting

The next FPD Materials & Components Japan TC Chapter meeting will be held as follows.

· Date: Friday, February 14, 2019

· Time: TBD

· Venue: SEMI Japan, Tokyo