SEMI International Standards
Standards Locale: North America
Committee: HB-LED
Place of Meeting: SEMI Headquarters in San Jose, California
Date of Meeting: 11/06/2014
Meeting End Date: 11/06/2014
Recording SEMI Standards Staff: Michael Tran
CER Posted to Web: 11/18/2014


Leadership Changes

Group
Previous Leader
New Leader
NA HB-LED TC ChapterBill Quinn (WEQ Consulting), stepped down as co-chairEric Armour (Veeco), new co-chair pending NARSC approval.
NA HB-LED Tablet Working GroupChris Moore (BayTech-Resor)
NARSCChris Moore (BayTech-Resor) is now the primary co-chair representative of the NA HB-LED TC Chapter for the NARSC.


Committee Structure Changes
None.

Ballot Results
Passed ballots and line items will be submitted to the ISC Audit & Review Subcommittee for procedural review.
Failed ballots and line items were returned to the originating task forces for re-work and re-balloting.
Document #
Document Title
TC Chapter Action
A&R Forms for Approved Ballots
5741Line item revisions to SEMI HB1-0814, Specifications for Sapphire Wafers Intended for Use for Manufacturing High Brightness-Light Emitting Diode Devices5741ProceduralReview.doc5741ProceduralReview.doc
Line Item 1Update References to Section 3.1 and Table R1-1, Row 2-3.8 and Row 2-3.10Passed TC Chapter review as balloted.


Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities

Listing of all new TFOFs, SNARFs, and other activities approved by the TC Chapter.
#
Type
SC/TF/WG
Details
---TFOFKorea HB-LED WGHB-LED Source Materials TF (New Task Force under the NA HB-LED TC Chapter)
5818SNARFHB-LED Wafer TF Line Items Revision to SEMI HB1-XXXX, Specifications for Sapphire Wafers Intended for Use for Manufacturing High Brightness-Light Emitting Diode Devices

(There is a prior revision of SEMI HB1-0814 (Document 5741) pending further procedural review and publication. This SNARF will be effective after the outcome of Document 5741.)
Note: SNARFs and TFOFs are available for review on the SEMI Web site at:
http://downloads.semi.org/web/wstdsbal.nsf/TFOFSNARF

Authorized Ballots

Listing of documents approved by the TC Chapter for letter ballot.
#
When
SC/TF/WG
Details
5747Cycle 1, 2015HB-LED Test Methods TFNew Standard: Test Method for Measurement of Saw Marks on Crystalline Sapphire Wafers Using Optical Probes
5748Cycle 1, 2015HB-LED Test Methods TFNew Standard: Test Method for Measurement of Thickness and Shape of Crystalline Sapphire Wafers Using Optical Probes
5749Cycle 1, 2015HB-LED Test Methods TFNew Standard: Test Method for Measurement of Waviness of Crystalline Sapphire Wafers Using Optical Probes


SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
The next NA Standards HB-LED Meetings will be held on April 2, 2015 in conjunction with the NA Standards Spring 2015 Meetings at SEMI Headquarters in San Jose, California. Exact meeting dates and details as they become available will be posted here and will be posted at the SEMI Standards Calendar of Events: http://www.semi.org/en/Standards/CalendarEvents

*Tentative Schedule*

Thursday, April 2*
· HB-LED Wafer TF / Impurities & Defects TF (09:00 AM - 11:00 AM)
· HB-LED Tablet WG (11:00 AM - 12:00 PM)
· NA HB-LED Technical Committee Chapter (1:30 PM - 4:30 PM)

*All times are in Pacific Time. Times and dates are subject to change without notice.