SEMI International Standards
Standards Locale: Europe |
Committee: Compound Semiconductor Materials |
Place of Meeting: Nürnberg, Germany |
Date of Meeting: 04/12/2016 |
Meeting End Date: 04/12/2016 |
|
Recording SEMI Standards Staff: Kevin Nguyen |
CER Posted to Web: 04/19/2016 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
None.
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
6015 | SNARF | SiC Material and Wafer Specification TF | Line Item Revision SEMI M81-0611 - Guide to Defects Found in Monocrystalline Silicon Carbide Substrates (5 year review) |
Authorized Ballots
None.
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
Tentatively in conjunction with DGKK (www.dgkk.de) Fall Meeting, date to be defined.
Copyright ©2024 Semiconductor Equipment and Materials International (SEMI®). All rights reserved.