SEMI International Standards
| Standards Locale: Japan |
| Committee: FPD - Materials & Components, FPD - Metrology |
| Place of Meeting: SEMI Japan/ OVTCCM |
| Date of Meeting: 02/16/2024 |
| Meeting End Date: 02/16/2024 |
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| Recording SEMI Standards Staff: Akiko Yoshida |
| CER Posted to Web: 03/01/2024 |
Leadership Changes
WG/TF/SC/TC Name | Previous Leader | New Leader |
| FPD Materials and Components Japan TC Chapter |
| None | | |
| FPD Metrology Japan TC Chapter |
| FPD Metrology Maintenance Task Force | -- | Ryoichi Watanabe (Japan Display)
Akira Kawaguchi (Otsuka Electronics)
Tadahiro Furukawa (Yamagata Univ.) |
Committee Structure Changes
Previous WG/TF/SC Name | New WG/TF/SC Name or Status Change |
| FPD Materials and Components Japan TC Chapter |
| None | |
| FPD Metrology Japan TC Chapter |
| -- | FPD Metrology Maintenance Task Force |
Ballot Results
Document # | Document Title | TC Chapter Action | A&R Forms for Approved Ballots |
| FPD Materials and Components Japan TC Chapter |
| 7157 | Line Item Revision to SEMI D38-0723, GUIDE FOR QUALITY AREA OF FLAT PANEL DHISPLAY (FPD) MASKS | | |
| Line Item 1 | Correction of the Inequality Signs | Passed |  7157_Ballot report_D38-0723_Line Item Revision.pdf |
| FPD Metrology Japan TC Chapter |
| None | | | |
Note 1: Passed ballots and line items will be submitted to the ISC Audit & Review Subcommittee for procedural review.
Note 2: Failed ballots and line items were returned to the originating task forces for re-work and re-balloting or abandoning.
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
| FPD Materials and Components Japan TC Chapter |
| 7215 | SNARF | FPD Materials & Components Maintenance Task Force | Reapproval of SEMI D22-0818, Test Method for the Determination of Color, Transmittance of FPD Color Filter Assemblies |
| 7216 | SNARF | FPD Materials & Components Maintenance Task Force | Reapproval of SEMI D29-0519, Test Method for Heat Resistance in Flat Panel Display Color Filters |
| 7217 | SNARF | FPD Materials & Components Maintenance Task Force | Reapproval of SEMI D30-0519, Test Method for Light Resistance in Flat Panel Display Color Filters |
| 7218 | SNARF | Flexible Display Task Force | Reapproval of SEMI D66-0519, Terminology for Plastic Substrates of Flexible Display |
| 7219 | SNARF | FPD Materials & Components Maintenance Task Force | Reapproval of SEMI D67-0819, Test Method for Antifouling Property and Chemical Resistance of FPD Polarizing Films and Its Materials |
| FPD Metrology Japan TC Chapter |
| -- | TFOF | FPD Metrology Maintenance Task Force | Newly formed. |
Note 1: SNARFs and TFOFs are available for review on the SEMI Web site at:
http://downloads.semi.org/web/wstdsbal.nsf/TFOFSNARF
Authorized Ballots
# | When | TF | Details |
| FPD Materials and Components Japan TC Chapter |
| 7215 | Cycle 3-24 | FPD Materials & Components Maintenance Task Force | Reapproval of SEMI D22-0818, Test Method for the Determination of Color, Transmittance of FPD Color Filter Assemblies |
| 7216 | Cycle 3-24 | FPD Materials & Components Maintenance Task Force | Reapproval of SEMI D29-0519, Test Method for Heat Resistance in Flat Panel Display Color Filters |
| 7217 | Cycle 3-24 | FPD Materials & Components Maintenance Task Force | Reapproval of SEMI D30-0519, Test Method for Light Resistance in Flat Panel Display Color Filters |
| 7218 | Cycle 3-24 | Flexible Display Task Force | Reapproval of SEMI D66-0519, Terminology for Plastic Substrates of Flexible Display |
| 7219 | Cycle 3-24 | FPD Materials & Components Maintenance Task Force | Reapproval of SEMI D67-0819, Test Method for Antifouling Property and Chemical Resistance of FPD Polarizing Films and Its Materials |
| FPD Metrology Japan TC Chapter |
| None | | | |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
FPD Materials & Components Japan TC Chapter and FPD Metrology Japan TC Chapter joint meeting will be held on Friday, June 21, 2024 14:00-17:00 via OVTCCM and at SEMI Japan, Tokyo, Japan.
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