SEMI International Standards
Standards Locale: Europe |
Committee: Compound Semiconductor Materials |
Place of Meeting: Official Virtual TC Chapter Meeting |
Date of Meeting: 01/28/2021 |
Meeting End Date: 01/28/2021 |
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Recording SEMI Standards Staff: Kevin Nguyen |
CER Posted to Web: 01/28/2021 |
Leadership Changes
None.
Committee Structure Changes
Ballot Results
None.
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
6716 | SNARF | Full-Wafer TSD Density Mapping of 4H-SiC TF | New Standard: Test Method for quantifying TSDs in 4H-SiC Crystals |
Authorized Ballots
# | When | TF | Details |
6615 | Cycle 2-21 | SiC Material and Wafer Specification TF | Revision of SEMI M55-0817, Specification for Polished Monocrystalline Silicon Carbide Wafers |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
Tentative April 29, 2021 via Official Virtual TC Chapter meeting. Please check www.semi.org/standards for latest information
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