SEMI International Standards
|Standards Locale: North America|
|Place of Meeting: OVTCCM|
|Date of Meeting: 07/19/2023|
|Meeting End Date: 07/19/2023|
|Recording SEMI Standards Staff: Michelle Sun|
|CER Posted to Web: 08/02/2023|
Committee Structure Changes
|License Server Certification Task Force [New]||Sashi Subramanian (Cadence)|
Previous WG/TF/SC Name
New WG/TF/SC Name or Status Change
|License Server Certification Task Force [New]|
Note 1: Passed ballots and line items will be submitted to the ISC Audit & Review Subcommittee for procedural review.
TC Chapter Action
A&R Forms for Approved Ballots
|7060||Reapproval of SEMI T17-0706 (Reapproved 0718), Specification of Substrate Traceability||Passed||AR - 7060.pdf|
|7061||Reapproval of SEMI T10-0701 (Reapproved 0618), Test Method for the Assessment of 2D Data Matrix Direct Mark Quality||Passed||AR - 7061.pdf|
|7062||Reapproval of SEMI T18-1106 (Reapproved 0718), Specification of Parts and Components Traceability||Failed|
Note 2: Failed ballots and line items were returned to the originating task forces for re-work and re-balloting or abandoning.
Ratification Ballot Results
Activities Approved by the GCS between meetings of TC Chapter meeting
SNARF(s) Granted a One-Year Extension
Standard(s) to receive Inactive Status
|7136||Cycle 7-2023||5-Year Review TF||Reapproval of SEMI T3-1213 (Reapproved 0419), Specification for Wafer Box Labels|
Special Announcements of the Committee (Workshops, Programs, etc.)
|SEMI T18-1106 (Reapproved 0718)||Specification of Parts and Components Traceability|
The next meeting is tentatively scheduled for Wednesday, November 15, 2023, at SEMI HQ, Milpitas. See http://www.semi.org/standards-events for the current list of events.
Copyright ©2023 Semiconductor Equipment and Materials International (SEMI®). All rights reserved.