SEMI International Standards
Standards Locale: Japan |
Committee: 3D Packaging and Integration |
Place of Meeting: SEMI Japan office, Tokyo, Japan |
Date of Meeting: 07/10/2020 |
Meeting End Date: 07/10/2020 |
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Recording SEMI Standards Staff: Chie Yanagisawa |
CER Posted to Web: 07/21/2020 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
6497A | Line Item Revision to SEMI G95-0314 with non-conforming title change to "Specification for Mechanical Features of 450 mm Load Port for Tape Frame Cassettes in The Backend Process" | -- | 6497A_BallotReport(Line Item)_r1.pdf |
Line Item 1 | Document title is changed based on A4-1-4 of procedure manual | Passed as balloted | -- |
6635 | Reapproval of SEMI G74-0699 (Reapproved 0215) Specification for Tape Frame for 300 mm Wafers | Passed as balloted | 6635_BallotReport_G74_Reapproval_r1.pdf |
6636 | Reapproval of SEMI G77-0699 (Reapproved 0215) Specification for Frame Cassette for 300 mm Wafers | Passed as balloted | 6636_BallotReport_G77_Reapproval_r1.pdf |
6637 | Reapproval of SEMI G82-1115 Specification for 300 mm Load Port for Frame Cassettes in Backend Process | Passed as balloted | 6637_BallotReport_G82_Reapproval_r1.pdf |
6638 | Reapproval of SEMI G87-1108 (Reapproved 0215) Specification for Plastic Tape Frame for 300 mm Wafer | Passed as balloted | 6638_BallotReport_G87_Reapproval_r1.pdf |
6639 | Reapproval of SEMI G92-0315 Specification for Tape Frame Cassette for 450 mm Wafer | Passed as balloted | 6639_BallotReport_G92_Reapproval_r1.pdf |
6640 | Revision to SEMI G52-1115 Test Method For Measurement Of Ionic Contamination On Semiconductor Leadframes | Passed as balloted | 6640_BallotReport_G52_Reapproval_r1.pdf |
The following ballots reviews are transferred from NA TC Chapter (approved by the GCS) |
6631: | Line Item Revision to SEMI 3D12-0315, Guide for Measuring Flatness and Shape of Low Stiffness Wafers | -- | 6631_Ballot Line-Item report_r2.pdf |
Line Item 1 | Clarify the Purpose statement in ¶1.3. | Passed with editorial changes | -- |
Line Item 2 | Add definition of precise monofilament and revise definitions in Terminology §5 for clarity. | Passed as balloted | -- |
6591 | Revision to SEMI 3D20-0719, Specification for Panel Characteristics for Panel Level Packaging (PLP) Applications | Failed and returned to the TF for rework | 6591_Ballot Report.pdf |
Note 1: Passed ballots and line items will be submitted to the ISC Audit & Review Subcommittee for procedural review.
Note 2: Failed ballots and line items were returned to the originating task forces for re-work and re-balloting or abandoning.
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
No activity requested by the Japan TC Chapter between meetings.
*The NA TC Chapter requested for transferring the ballot reviews of 6591 and 6631 at the Japan TC Chapter meeting on July 10 and the GCS approved them.
Authorized Activities
None.
Authorized Ballots
# | When | TF | Details |
6590 | Cycle X-2020 | PLP Glass Carrier TF | New Standard: Specification for Glass Carrier Characteristics for Panel Level Packaging (PLP) Applications |
6496 | Cycle X-2020 | 3D Packaging & Integration 5 Year Review TF | Line Item Revision to SEMI G63-95 (Reapproved 0811) “Test Method for Measurement of Die Shear Strength” |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
The next TC Chapter meeting will be held as follows.
- Date: Friday, November 13
- Time: 15-17 [JST]
- Place: SEMI Japan office, Tokyo Japan
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