SEMI International Standards
Standards Locale: Europe |
Committee: Photovoltaic - Materials |
Place of Meeting: Halle, Germany |
Date of Meeting: 05/24/2019 |
Meeting End Date: 05/24/2019 |
|
Recording SEMI Standards Staff: James Amano |
CER Posted to Web: 07/24/2019 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
None.
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
6543 | SNARF | PV Silicon Materials TF | Reapproval of SEMI PV42-0314: Test Method for In-Line Measurement of Waviness of PV Silicon Wafers by a Light Sectioning Technique Using Multiple Line Segments |
6544 | SNARF | PV Silicon Materials TF | Reapproval of SEMI PV51-0214: Test Method for In-Line Characterization of Photovoltaic Silicon Wafers by Using Photoluminescence |
6545 | SNARF | PV Silicon Materials TF | Reapproval of SEMI PV52-0214: Test Method for In-Line Characterization of Photovoltaic Silicon Wafers Regarding Grain Size |
Authorized Ballots
# | When | TF | Details |
6373 | Cycle 6 or 7-2019 | PV Material Degradation TF | New Standard: Test Method for Silicon PV Materials for Light-Induced Degradation (LID) |
6543 | Cycle 6 or 7-2019 | PV Silicon Materials TF | Reapproval of SEMI PV42-0314: Test Method for In-Line Measurement of Waviness of PV Silicon Wafers by a Light Sectioning Technique Using Multiple Line Segments |
6544 | Cycle 6 or 7-2019 | PV Silicon Materials TF | Reapproval of SEMI PV51-0214: Test Method for In-Line Characterization of Photovoltaic Silicon Wafers by Using Photoluminescence |
6545 | Cycle 6 or 7-2019 | PV Silicon Materials TF | Reapproval of SEMI PV52-0214: Test Method for In-Line Characterization of Photovoltaic Silicon Wafers Regarding Grain Size |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
SEMICON Europa, November 2019, Munich, Germany
Check https://www.semi.org/en/collaborate/standards
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