SEMI International Standards
Standards Locale: North America |
Committee: Photovoltaic - Materials |
Place of Meeting: Moscone South Hall - San Francisco, CA |
Date of Meeting: 07/09/2019 |
Meeting End Date: 07/09/2019 |
|
Recording SEMI Standards Staff: Kevin Nguyen |
CER Posted to Web: 07/17/2019 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
None.
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
tbd | SNARF | Int’l PV Analytical Test Methods, Metrology, and Inspection TF | Reapproval of SEMI PV13 - Test Method for Contactless Excess-Charge-Carrier Recombination Lifetime Measurement in Silicon Wafers, Ingots, and Bricks Using an Eddy-Current Sensor |
Authorized Ballots
# | When | TF | Details |
tbd | Cycle 1-2020 | Int’l PV Analytical Test Methods, Metrology, and Inspection TF | Reapproval of SEMI PV13 - Test Method for Contactless Excess-Charge-Carrier Recombination Lifetime Measurement in Silicon Wafers, Ingots, and Bricks Using an Eddy-Current Sensor |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
July 22, 2020 San Francisco, CA in conjunction with SEMICON West. Check www.semi.org/standards for more details.
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