SEMI International Standards
Standards Locale: North America
Committee: Photovoltaic - Materials
Place of Meeting: Moscone South Hall - San Francisco, CA
Date of Meeting: 07/09/2019
Meeting End Date: 07/09/2019
Recording SEMI Standards Staff: Kevin Nguyen
CER Posted to Web: 07/17/2019


Leadership Changes
None.

Committee Structure Changes
None.

Ballot Results
None.

Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities

#
Type
SC/TF/WG
Details
tbdSNARFInt’l PV Analytical Test Methods, Metrology, and Inspection TFReapproval of SEMI PV13 - Test Method for Contactless Excess-Charge-Carrier Recombination Lifetime Measurement in Silicon Wafers, Ingots, and Bricks Using an Eddy-Current Sensor


Authorized Ballots

#
When
TF
Details
tbdCycle 1-2020Int’l PV Analytical Test Methods, Metrology, and Inspection TFReapproval of SEMI PV13 - Test Method for Contactless Excess-Charge-Carrier Recombination Lifetime Measurement in Silicon Wafers, Ingots, and Bricks Using an Eddy-Current Sensor


SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
July 22, 2020 San Francisco, CA in conjunction with SEMICON West. Check www.semi.org/standards for more details.