SEMI International Standards
Standards Locale: North America |
Committee: Micropatterning |
Place of Meeting: Online |
Date of Meeting: 03/28/2023 |
Meeting End Date: 03/28/2023 |
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Recording SEMI Standards Staff: Kevin Nguyen |
CER Posted to Web: 04/12/2023 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
Document # | Document Title | TC Chapter Action | A&R Forms for Approved Ballots |
6821 | New Preliminary Standard: SPECIFICATION FOR EXPERIMENTAL CURVILINEAR “MULTIGON” EXTENSION TO SEMI P39 OASIS | Approved | 6821_Ballot Report.pdf |
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
Authorized Activities
# | Type | SC/TF/WG | Details |
7027 | SNARF | TC Chapter | Reapproval of SEMI P39-0416 Specification for OASIS® – Open Artwork System Interchange Standard |
7026 | SNARF | TC Chapter | Reapproval of SEMI P44-1216 Specification for Open Artwork System Interchange Standard (OASIS ®) Specific to Mask Tools |
Authorized Ballots
# | When | TF | Details |
7027 | cycle 4-23 | TC Chapter | Reapproval of SEMI P39-0416 Specification for OASIS® – Open Artwork System Interchange Standard |
7026 | cycle 4-23 | TC Chapter | Reapproval of SEMI P44-1216 Specification for Open Artwork System Interchange Standard (OASIS ®) Specific to Mask Tools |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Abolished
# | TF | Title |
6220 | Patterning Metrology Task Force | Line Item revision to SEMI P19-92 (Reapproved 0707)
SPECIFICATION FOR METROLOGY PATTERN CELLS FOR INTEGRATED CIRCUIT MANUFACTURE |
6221 | Patterning Metrology Task Force | Revision to SEMI P18-92 (Reapproved 1104)
SPECIFICATION FOR OVERLAY CAPABILITIES OF WAFER STEPPERS |
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
October 31, 2023, 9 AM - 11 AM Pacific online. Check www.semi.org/standards for the latest update.
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