SEMI International Standards
Standards Locale: China |
Committee: HB-LED |
Place of Meeting: Dongguan,Guangdong |
Date of Meeting: 04/26/2023 |
Meeting End Date: |
 |
Recording SEMI Standards Staff: Cassie Li |
CER Posted to Web: 05/22/2023 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
None.
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
None.
Authorized Ballots
None.
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Abolished
None.
Standard(s) to receive Inactive Status
HB-LED |
SEMI HB8-0217 | Test Method for Determining Orientation of a Sapphire Single Crystal |
SEMI HB9-0818 | Test Method and Acceptance Criteria for Visual Inspection of Surface Defects of GaN Epitaxial Wafers Used for Manufacturing HB-LED |
SEMI HB10-1018 | Specification for Single Crystal Sapphire Intended for Use for Manufacturing HB-LED Wafers |
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
The next meeting of the Compound Semiconductor Materials & HB-LED China TC Chapter is scheduled for TBD, 2023, China.
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