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Standards Locale: Japan

Committee: FPD - Materials & Components, FPD - Metrology

Place of Meeting: SEMI Japan Office, Tokyo, Japan via OVTCCM

Date of Meeting: 06/02/2023

Meeting End Date:

Recording SEMI Standards Staff: Hirofumi Kanno

CER Posted to Web: 06/14/2023

WG/TF/SC/TC Name	Previous Leader	New Leader
FPD Materials & Components Japan TC
None
FPD Metrology Japan TC
FPD Metrology Japan TC	Ryoichi Watanabe – Japan Display, Akira Kawaguchi – Otsuka Electronics Satoshi Tomioka - Sony	Ryoichi Watanabe – Japan Display, Akira Kawaguchi – Otsuka Electronics

Committee Structure Changes

Previous WG/TF/SC Name	New WG/TF/SC Name or Status Change
None

Ballot Results

Document #	Document Title	TC Chapter Action	A&R Forms for Approved Ballots
FPD Materials & Components Japan TC
6977	Line Item Revision to SEMI D34-0710 (Reapproved), Test Method for FPD Polarizing Films		5_Ballot report Doc. 6977 (Line Item revision 1-2)20230531Final.pdf
Line Item 1	Reformat sections to meet the requirement which is specified in section 3.2 of Procedure Manual	Passed with editorial changes
Line Item 2	Update several references	Passed with editorial changes
FPD Metrology Japan TC
None

Note 1: Passed ballots and line items will be submitted to the ISC Audit & Review Subcommittee for procedural review.

Note 2: Failed ballots and line items were returned to the originating task forces for re-work and re-balloting or abandoning.

Ratification Ballot Results

#	Type	SC/TF/WG	Details
None

Activities Approved by the GCS between meetings of TC Chapter meeting

#	Type	SC/TF/WG	Details
None

Authorized Activities
Listing of all revised or new SNARF(s) approved by the Originating TC Chapter.

#	Type	SC/TF/WG	Details
FPD Materials & Components Japan TC
TBA	SNARF	FPD Materials & Components Maintenance Task Force	Reapproval of SEMI D60-0818: TESR METHOD OF SURFACE SCRATCH RESISTANCE FOR FPD POLARIZING FILM AND COVER PLASTICS FOR MOBILE DISPLAYS
TBA	SNARF		Reapproval of SEMI D77-0618: Test Method for Measurements of Dimension of Films for FPD – Contour Matching Method
TBA	SNARF		REAPPROVARL TO SEMI D63-0818: TEST METHOD FOR DEPOLARIZATION EFFECT OF FPD COLOR FILTER
FPD Metrology Japan TC
None

Note 1: SNARFs and TFOFs are available for review on the SEMI Web site at:

http://downloads.semi.org/web/wstdsbal.nsf/TFOFSNARF


Authorized Ballots
Listing of documents authorized by the Originating TC Chapter for Letter Ballot.

#	When	TF	Details
FPD Materials & Components Japan TC
TBA	Cycle 6 and beyond	FPD Materials & Components Maintenance Task Force	Reapproval of SEMI D60-0818: TESR METHOD OF SURFACE SCRATCH RESISTANCE FOR FPD POLARIZING FILM AND COVER PLASTICS FOR MOBILE DISPLAYS
TBA	Cycle 6 and beyond		Reapproval of SEMI D77-0618: Test Method for Measurements of Dimension of Films for FPD – Contour Matching Method
TBA	Cycle 6 and beyond		REAPPROVARL TO SEMI D63-0818: TEST METHOD FOR DEPOLARIZATION EFFECT OF FPD COLOR FILTER
FPD Metrology Japan TC
None

SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Abolished
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

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