SEMI International Standards
Standards Locale: Europe
Committee: Compound Semiconductor Materials
Place of Meeting: Official Virtual TC Chapter Meeting
Date of Meeting: 07/25/2023
Meeting End Date: 07/25/2023
Recording SEMI Standards Staff: Kevin Nguyen
CER Posted to Web: 07/25/2023


Leadership Changes
None.

Committee Structure Changes
None.

Ballot Results

Document #
Document Title
TC Chapter Action
A&R Forms for Approved Ballots
6870New Standard: Test Method for Quantifying Basal Plane Disclocation Density in 4h Sic by X Ray Diffraction Topography/ImagingPassed as balloted6870 A&R.pdf6870 A&R.pdf
7053Line Item Revisions of SEMI M63, Test Method for Measuring the Al Fraction in AlGaAs on GaAs Substrates by High Resolution X-Ray Diffraction Passed as balloted7053 A&R.pdf7053 A&R.pdf


Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities

#
Type
SC/TF/WG
Details
7111SNARFSiC Material and Wafer Specification TFRevision of SEMI M81 Guide to Defects Found in Monocrystalline Silicon Carbide Substrates


Authorized Ballots
None.

SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Abolished
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
Tentative, Wed, Nov 15, 2023 in conjunction with SEMICON Europa. Check www.semi.org/standards for the latest update.