SEMI International Standards
Standards Locale: Europe |
Committee: Compound Semiconductor Materials |
Place of Meeting: Online |
Date of Meeting: 04/29/2021 |
Meeting End Date: 04/29/2021 |
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Recording SEMI Standards Staff: Kevin Nguyen |
CER Posted to Web: 04/29/2021 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
6515 | Revision of SEMI M55-0817, Specification For Polished Monocrystalline Silicon Carbide Wafers (To Include 200 mm wafer) | Passed with editorial changes | 6615 A&R.pdf |
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Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
6779 | SNARF | 5 Year Review Task Force | Reapproval of SEMI M64 - Test Method for the EL2 Deep Donor Concentration in Semi-Insulating (SI) Gallium Arsenide Single Crystals by Infrared Absorption Spectroscopy |
6780 | SNARF | 5 Year Review Task Force | Line Item Revision of SEMI M87 - Test Method for Contactless Resistivity Measurement of Semi-Insulating Semiconductors |
Note 1: SNARFs and TFOFs are available for review on the SEMI Web site at:
http://downloads.semi.org/web/wstdsbal.nsf/TFOFSNARF
Authorized Ballots
# | When | TF | Details |
6779 | Cycle 5-21 | 5 Year Review Task Force | Reapproval of SEMI M64 - Test Method for the EL2 Deep Donor Concentration in Semi-Insulating (SI) Gallium Arsenide Single Crystals by Infrared Absorption Spectroscopy |
6780 | Cycle 5-21 | 5 Year Review Task Force | Line Item Revision of SEMI M87 - Test Method for Contactless Resistivity Measurement of Semi-Insulating Semiconductors |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
July 29, 2021 4:30 PM - 6:30 PM CET. Check www.semi.org/standards for latest update.
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