SEMI International Standards
Standards Locale: Europe |
Committee: Compound Semiconductor Materials |
Place of Meeting: Munich, Germany |
Date of Meeting: 11/21/2019 |
Meeting End Date: 11/21/2019 |
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Recording SEMI Standards Staff: James Amano |
CER Posted to Web: 11/21/2019 |
Leadership Changes
WG/TF/SC/TC Name | Previous Leader | New Leader |
SiC Material and Wafer Specification TF | | Tom Barbieri (Cree) joins Arnd Weber (SiCrystal) as co-leader |
Committee Structure Changes
None.
Ballot Results
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
6474 | Revision to SEMI M82-0813: Test Method for the Carbon Acceptor Concentration in Semi-Insulating Gallium Arsenide Single Crystals by Infrared Absorption Spectroscopy | Passed | |
6546 | Revision to SEMI M83-0913 Test Method For Determination Of Dislocation Etch Pit Density In Monocrystals Of III-V Compound Semiconductors | Passed | |
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
TBD | SNARF | SiC Material and Wafer Specification TF | Revision of SEMI M55-0817, Specification for Polished Monocrystalline Silicon Carbide Wafers |
Authorized Ballots
None.
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
In conjunction with SEMICON Europa 2020 in Munich, Germany. Check the events page at https://www.semi.org/en/collaborate/standards for details.
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