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SEMI International Standards
Standards Locale: North America
Committee: Silicon Wafer
Place of Meeting: SEMI HQ, Milpitas, CA
Date of Meeting: 03/26/2024
Meeting End Date: 03/26/2024
Recording SEMI Standards Staff: Kevin Nguyen
CER Posted to Web: 04/04/2024


Leadership Changes
None.

Committee Structure Changes
None.

Ballot Results
None.

Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities

#
Type
SC/TF/WG
Details
TBDSNARFInt'l Test Methods TFReapproval of SEMI MF1528-0413 (Reapproved 1018) Test Method for Measuring Boron Contamination in Heavily Doped N-Type Silicon Substrates by Secondary Ion Mass Spectrometry
TBDSNARFInt'l ASI TFReapproval of SEMI M35-1114 (Reapproved 1019) Guide for Developing Specifications for Silicon Wafer Surface Features Detected by Automated Inspection


Authorized Ballots

#
When
TF
Details
TBDCycle 4 or 5 of 2024Int'l Test Methods TFReapproval of SEMI MF1528-0413 (Reapproved 1018) Test Method for Measuring Boron Contamination in Heavily Doped N-Type Silicon Substrates by Secondary Ion Mass Spectrometry
TBDCycle 4 or 5 of 2024Int'l ASI TFReapproval of SEMI M35-1114 (Reapproved 1019) Guide for Developing Specifications for Silicon Wafer Surface Features Detected by Automated Inspection


SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
July 9, 2024 9 AM - Noon at Moscone Center in San Francisco, CA in conjunction with SEMICON West. Check www.semi.org/standards for the latest update











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