SEMI International Standards
Standards Locale: North America |
Committee: Silicon Wafer |
Place of Meeting: SEMI HQ, Milpitas, CA |
Date of Meeting: 03/26/2024 |
Meeting End Date: 03/26/2024 |
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Recording SEMI Standards Staff: Kevin Nguyen |
CER Posted to Web: 04/04/2024 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
None.
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
TBD | SNARF | Int'l Test Methods TF | Reapproval of SEMI MF1528-0413 (Reapproved 1018) Test Method for Measuring Boron Contamination in Heavily Doped N-Type Silicon Substrates by Secondary Ion Mass Spectrometry |
TBD | SNARF | Int'l ASI TF | Reapproval of SEMI M35-1114 (Reapproved 1019) Guide for Developing Specifications for Silicon Wafer Surface Features Detected by Automated Inspection |
Authorized Ballots
# | When | TF | Details |
TBD | Cycle 4 or 5 of 2024 | Int'l Test Methods TF | Reapproval of SEMI MF1528-0413 (Reapproved 1018) Test Method for Measuring Boron Contamination in Heavily Doped N-Type Silicon Substrates by Secondary Ion Mass Spectrometry |
TBD | Cycle 4 or 5 of 2024 | Int'l ASI TF | Reapproval of SEMI M35-1114 (Reapproved 1019) Guide for Developing Specifications for Silicon Wafer Surface Features Detected by Automated Inspection |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
July 9, 2024 9 AM - Noon at Moscone Center in San Francisco, CA in conjunction with SEMICON West. Check www.semi.org/standards for the latest update
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