SEMI International Standards
Standards Locale: Europe
Committee: Compound Semiconductor Materials
Place of Meeting: Official Virtual TC Chapter Meeting
Date of Meeting: 05/03/2023
Meeting End Date: 05/03/2023
Recording SEMI Standards Staff: Kevin Nguyen
CER Posted to Web: 05/04/2023


Leadership Changes
None.

Committee Structure Changes
None.

Ballot Results
None.

Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities

#
Type
SC/TF/WG
Details
7053SNARF5 Year Review TFLine Item Revisions of SEMI M63, Test Method for Measuring the Al Fraction in AlGaAs on GaAs Substrates by High Resolution X-Ray Diffraction


Authorized Ballots

#
When
TF
Details
6870Cycle 5-23Test Methods TFNew Standard: Test Method for Quantifying Basal Plane Dislocations in 4H-SiC by X-ray Topography
7053Cycle 5-235 Year Review TFLine Item Revisions of SEMI M63, Test Method for Measuring the Al Fraction in AlGaAs on GaAs Substrates by High Resolution X-Ray Diffraction


SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Abolished
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
July 25, 2023 4:30 PM - 6:30 PM CEST, via Official Virtual TC Chapter Meeting. Check www.semi.org/standards for the latest update.