SEMI International Standards
| Standards Locale: Europe |
| Committee: Compound Semiconductor Materials |
| Place of Meeting: Official Virtual TC Chapter Meeting |
| Date of Meeting: 04/09/2024 |
| Meeting End Date: 04/09/2024 |
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| Recording SEMI Standards Staff: Kevin Nguyen |
| CER Posted to Web: 04/09/2024 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
Document # | Document Title | TC Chapter Action | A&R Forms for Approved Ballots |
| 7161 | Line-Item Revision of SEMI M93-0923 Test Method For Quantifying Basal Plane Dislocation Density In 4H-SiC By X-Ray Diffraction Topography/Imaging | |  7161 A&R.pdf |
| Line Item 1 | Make changes in Appendix 1 | Passed as balloted | |
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
| TBD | SNARF | 5 Year Review TF | Line Item Revision of SEMI M54 - Guide for Semi-Insulating (SI) GaAs Material Parameters, |
| TBD | SNARF | Silicon Carbide Engineered Substrate TF | New Standard: Specification for Silicon Carbide Engineered Substrate |
Authorized Ballots
# | When | TF | Details |
| TBD | Cycle 4, 5 of 2024 | 5 Year Review TF | Line Item Revision of SEMI M54 - Guide for Semi-Insulating (SI) GaAs Material Parameters, |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
August 6, 2024, 4:30 PM - 6:30 PM CET, Online, Summer Meeting. Check www.semi.org/standards for the latest update.
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