SEMI International Standards
| Standards Locale: North America |
| Committee: Traceability |
| Place of Meeting: OVTCCM |
| Date of Meeting: 11/15/2023 |
| Meeting End Date: |
 |
| Recording SEMI Standards Staff: Michelle Sun |
| CER Posted to Web: 11/28/2023 |
Leadership Changes
None.
Committee Structure Changes
None.
Ballot Results
Document # | Document Title | TC Chapter Action | A&R Forms for Approved Ballots |
| 7136 | Reapproval of SEMI T3-1213 (Reapproved 0419), Specification for Wafer Box Labels | Passed |  AR - 7136.pdf |
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
None.
Authorized Ballots
None.
SNARF(s) Granted a One-Year Extension
# | TF | Title | Expiration Date |
| 6504 | SDT TF | New Standard: Specification for Counterfeit Prevention for the Electronics Manufacturing Supply Chain | 11/10/2024 |
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
None.
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