SEMI International Standards
Standards New Activity Report Form (SNARF)
Date Prepared: 03/31/2010Revised (if Applicable):

Document Number: 4921
SNARF for: New Standard: Guide for Specifying BRDF Metrics to Monitor the Surface Roughness and Texture of PV Materials

Originating Global Technical Committee: Photovoltaic
Originating TC Chapter: North America
Task Force (TF) in which work is to be carried out: PV Electrical & Optical Properties Measurements Task Force
Note: If a new task force is needed, also submit a task force organization form (TFOF)

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1. Rationale:
a. Describe the need or problem addressed by this activity.
(Indicate the customer, what benefits they will receive, and if possible, quantify the impact on the return on investment [ROI] if the Document is implemented.)
Many surfaces used in the photovoltaic industry are textured in order to optimize light absorption and maximize cell efficiency. The amount and nature of texture required differs with material and cell design; however, in general these surfaces are not optically smooth – that is they are not mirrors. In addition, the required texture is not well defined by a single roughness, gloss or haze specification because the relative amount of low and high frequency roughness on the surface can be important. Thus two or more parameters may have to be specified. Profile measurements may provide enough information, but these are slow, vibration sensitive and expensive. Light scatter measured over a range of angles (or several angles) provides a fast, economical means to monitor texture over a range of roughness frequencies. The proposed document provides a means to specify measured scatter in BRDF units, for both lab and production settings, so that surface texture can be kept within previously determined acceptable bounds.


b. Estimate effect on industry.
1: Major effect on entire industry or on multiple important industry sectors
Sector or Company Information:

c. Estimate technical difficulty of the activity.
II: Some Difficulty - Disagreements on known requirements exist but developing consensus is possible

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2. Scope:
a: Describe the technical areas to be covered or addressed by this Document development activity. For Subordinate Standards, list common concepts or criteria that the Subordinate Standard inherits from the Primary Standard, as well as differences from the Primary Standard:
The proposed standard will rely on SEMI ME1392-1109 - Guide for Angle Resolved Optical Scatter Measurements on Specular or Diffuse Surfaces, which defines the calculation and measurement of bidirectional reflectance distribution function (or BRDF). The proposed document will provide a means to specify BRDF max/min limitations as a function of angle or at prescribed angles.

b: Expected result of activity
New Standard

For a new Subordinate Standard, identify the Primary Standard here:




For Standards, identify the Standard Subtype below:


Miscellaneous (describe below):

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3. Projected Timetable for Completion:

a: General Milestones
a. Activity Start: 03/01/2010b. 1st Draft by: 04/01/2010
c. (Optional) Informational Ballot by: d. Letter Ballot by: 07/12/2010
e. TC Chapter Approval By:01/01/2011

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4. Liaisons with other Global Technical Committees/TC Chapters/Subcommittees/TFs:
a.
List global technical committees, TC Chapters, subcommittees, or task forces in your or other Regions/Locales that should be kept informed regarding the progress of this activity. (Refer to SEMI Standards organization charts and global technical committee charters as needed.)
Silicon Wafer Committee and ASI Task Force

b. Intercommittee Ballots:


Identify the recipient global technical committee(s):

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5. Safety Considerations:
The resulting document is expected:
NOT to be a Safety Guideline

NOTE FOR "to be a Safety Guideline": When all safety-related information is removed from the Document, the Document is NOT technically sound and complete - Refer to Section 14.1 of the Regulations for special procedures to be followed.

NOTE FOR "NOT to be a Safety Guideline": When all safety-related information is removed from the Document, the Document is still technically sound and complete.

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6. Intellectual Property Considerations:
a. For a new Standard or Safety Guideline and for any part to be modified or added in a Revision of published Standards and Safety Guidelines:
the use of patented technology or a copyrighted item(s) is NOT required

If "patented technology is intended to be included in the proposed Standard(s) or Safety Guideline(s) " is selected above, then also check one:


b. For Revision, Reapproval, Reinstatement, or Withdrawal of existing Standard(s) and Safety Guideline(s):


c. The body of the Document and any Appendices, Complementary Files, Related Information sections, or Various Materials that may or may not be a part of the Document by reference:
will NOT include copyrighted material



NOTE FOR "the use of patented technology or a copyrighted item(s) is NOT required": If in the course of developing the document, it is determined that patented technology or copyrighted item(s) must be used to comply with the standard or safety guideline, the provisions of Section 15 of the Regulations must be followed.)

NOTE FOR "will include reproduced copyrighted material": A copyright release letter must be obtained from the copyright owner.

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7. Comments, Special Circumstances:
None.

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8. TC Member Review:
None.

Member Review Start Date; None.
Member Review End Date: None.

NOTE FOR ‘TC Member Review’ is required by the Regulations for a period of at least two weeks
before approval of a new, or a major revision of an existing, Standard or Safety Guideline. (See Regulations 8.2.1)
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9.. SNARF Approval Dates:
TC Chapter or GCS03/31/2010
Recorded in TC Minutes03/31/2010
Attach Pictures and Files here: