SEMI International Standards
Standards New Activity Report Form (SNARF)
Date Prepared: 02/24/2009Revised (if Applicable): 07/16/2009

Document Number: 4738
SNARF for: New Standard: Test Method for Contactless Carrier Recombination Lifetime in Silicon Wafers and Ingots using RF-Eddy-Current Sensing

Originating Global Technical Committee: Photovoltaic
Originating TC Chapter: North America
Task Force (TF) in which work is to be carried out: International PV Analytical Test Methods Task Force
Note: If a new task force is needed, also submit a task force organization form (TFOF)

1. Rationale:
a. Describe the need or problem addressed by this activity.
(Indicate the customer, what benefits they will receive, and if possible, quantify the impact on the return on investment [ROI] if the Document is implemented.)
There are no international standards for minority-carrier lifetime measurement in PV silicon wafers or blocks. The measurement of lifetime in PV materials is quite mature, and existing semiconductor standards do not reflect the state-of-the-art understanding developed during the last 15 years in the PV field. The use of semiconductor wafer standards on PV material has technical problems and often contradicts best practice in the PV field. Some of the existing SEMI standards for the semiconductor industry are very particular to specific instruments and therefore not applicable to many of the lifetime measurement methods currently in widespread use.

b. Estimate effect on industry.
2: Major effect on an industry sector - identify the relevant sector
Sector or Company Information:

c. Estimate technical difficulty of the activity.
I: No Difficulty - Proven concepts and techniques exist or quick agreement anticipated

2. Scope:
a: Describe the technical areas to be covered or addressed by this Document development activity. For Subordinate Standards, list common concepts or criteria that the Subordinate Standard inherits from the Primary Standard, as well as differences from the Primary Standard:
The contactless measurement of minority-carrier lifetime in surface-passivated and unpassivated wafers, sections, and ingots using an RF-eddy-current sensor of excess carrier density.

b: Expected result of activity
New Standard

For a new Subordinate Standard, identify the Primary Standard here:

For Standards, identify the Standard Subtype below:

Miscellaneous (describe below):

3. Projected Timetable for Completion:

a: General Milestones
a. Activity Start: 06/01/2009b. 1st Draft by: 12/01/2009
c. (Optional) Informational Ballot by: 03/01/2010d. Letter Ballot by: 05/01/2010
e. TC Chapter Approval By:11/01/2010

4. Liaisons with other Global Technical Committees/TC Chapters/Subcommittees/TFs:
List global technical committees, TC Chapters, subcommittees, or task forces in your or other Regions/Locales that should be kept informed regarding the progress of this activity. (Refer to SEMI Standards organization charts and global technical committee charters as needed.)
SEMI N.A. PV Electrical Properties Measurements Task Force
SEMI Si Wafer Committee

b. Intercommittee Ballots:

Identify the recipient global technical committee(s):

5. Safety Considerations:
The resulting document is expected:
NOT to be a Safety Guideline

NOTE FOR "to be a Safety Guideline": When all safety-related information is removed from the Document, the Document is NOT technically sound and complete - Refer to Section 15.1 of the Regulations for special procedures to be followed.

NOTE FOR "NOT to be a Safety Guideline": When all safety-related information is removed from the Document, the Document is still technically sound and complete.

6. Intellectual Property Considerations:
a. For a new Standard or Safety Guideline and for any part to be modified or added in a Revision of published Standards and Safety Guidelines:
the use of patented technology or a copyrighted item(s) is NOT required

If "patented technology is intended to be included in the proposed Standard(s) or Safety Guideline(s) " is selected above, then also check one:

b. For Revision, Reapproval, Reinstatement, or Withdrawal of existing Standard(s) and Safety Guideline(s):

c. The body of the Document and any Appendices, Complementary Files, Related Information sections, or Various Materials that may or may not be a part of the Document by reference:
will NOT include copyrighted material

NOTE FOR "the use of patented technology or a copyrighted item(s) is NOT required": If in the course of developing the document, it is determined that patented technology or copyrighted item(s) must be used to comply with the standard or safety guideline, the provisions of Section 16 of the Regulations must be followed.)

NOTE FOR "will include reproduced copyrighted material": A copyright release letter must be obtained from the copyright owner.

7. Comments, Special Circumstances:
The project is anticipated to be difficult, because of the wide variety of materials quality and wafer types in PV silicon. Additionally, the bulk minority–carrier lifetime is generally not a directly measured quantity, but must be extracted from the instrument data using interpretation. This can lead to different values measured with different instruments or methodologies. Therefore, one goal of the standard would be to set rules sufficient to compare lifetimes as determined by different instruments, or to set a minimum set of requirements that could apply to many or most instruments.

A consensus may require a fairly broad minimum standard in contrast to a particular recipe standard.

8. TC Member Review:

Member Review Start Date; None.
Member Review End Date: None.

NOTE FOR ‘TC Member Review’ is required by the Regulations for a period of at least two weeks
before approval of a new, or a major revision of an existing, Standard or Safety Guideline. (See Regulations 8.2.1)
9.. SNARF Approval Dates:
TC Chapter or GCS07/16/2009
Recorded in TC Minutes07/16/2009
Attach Pictures and Files here: