SEMI International Standards
Task Force Organization Form (TFOF)

Task Force Name: International PV Analytical Test Methods Task Force

Global Technical Committee: Photovoltaic (PV) - Materials
Originating Technical Committee Region: North America

1. Charter:

To develop standards for analytical test methods for the International PhotoVoltaic industry.

2. Scope:
The following analytical techniques and application will first be pursued: GDMS, ICP-MS, ICP-OES, and IGA as applied to impurities in silicon feedstock for multi-crystalline Si PV.

Additional analytical techniques for solid materials will be considered as appropriate for application to both thin film PV and bulk PV, Si and non-Si, such as SIMS, XPS, AES, TOF-SIMS, SPM, TEM, SEM, EDS, RBS, HFS, PIXIE, TXRF, XRD, XRR, LEXES, FTIR, Lifetime and Raman.

3. Formal linkages with Task Forces in other Regions:
SEMI Si Wafer Committee
Fraunhofer Institutes

4. Approval:
Task Force formed on: 10/31/2007