Standards Doc. Bank

SEMI International Standards
Technical Committee Charter

Charter of Global Traceability Committee

    The Charter of Global Traceability Committee
    • Charter
      Capture user requirements and develop standards to enable full traceability of materials and other factory resources in semiconductor manufacturing. This will include marking and identification techniques, encode/decode methods, inter-company exchange of information, and characteristics of marking/reading sub-systems needed by the industry, from semiconductor, flat panel display, and other materials manufacturing through final product assembly and test.
    • Scope
      Standards of traceability including and not limited to:
      Encode/decode hardware and software
      Common symbologies
      Active/passive transponders
      Inter-company exchange of information (incl. Front-end to back-end exchange)
      Definitions of common manufacturing items on traceability
    • Current Activities
      1. Standards/Activities for ID and Tracking
        -Wafer box label
        -ID of Wafers and Other Substrates
        -Chip marking
        -Reticle ID
        -Marking symbology experiments
        -Application of ID tracking to Information & Control system
      2. Liaison Committees
        -Information and Control, Silicon Wafer, PI&C, and PV Committees