SEMI International Standards
Document Status Report

This page provides a the status of documents being worked on by various Task Forces in the SEMI International Standards program.

Use the pull-down menu below to browse a particular committee.


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Automated Test Equipment

4782InfoNew Standard: Specification for Standard Test Data Format (STDF) Memory Fail DatalogDrafting 11/11/2010Region of Action- NA
4782New Standard: Specification for Standard Test Data Format (STDF) Memory Fail DatalogFailed Technical Review and Returned to TF 11/10/2010Region of Action- NA
4782ANew Standard: Specification for Standard Test Data Format (STDF) Memory Fail DatalogFailed Technical Review and Returned to TF 03/30/2011Region of Action- NA
4782BNew Standard: Specification for Standard Test Data Format (STDF) Memory Fail DatalogFailed Technical Review and Returned to TF 07/13/2011Region of Action- NA
4782CNew Standard: Specification for Standard Test Data Format (STDF) Memory Fail DatalogPublished as SEMI G91-0513 05/24/2013Region of Action- NA
5011Withdrawal of SEMI G78, Test Method for Comparing Automated Wafer Probe Systems Utilizing Process-Specific MeasurementsFailed Technical Review and Returned to TF 03/30/2011Region of Action- NA
5011AWithdrawal of SEMI G78, Test Method for Comparing Automated Wafer Probe Systems Utilizing Process-Specific MeasurementsPublished 10/25/2011Region of Action- NA
5275Reapproval of SEMI G79-0200, Specification for Overall Digital Timing AccuracyPublished 05/14/2012Region of Action- NA
5276Reapproval of SEMI G80-0200, Test Method for the Analysis of Overall Digital Timing Accuracy for Automated Test EquipmentPublished 06/18/2012Region of Action- NA