| 5265 | New Standard: Specifications for 150 mm Diameter Sapphire Wafers Intended for Use for Manufacturing HB-LED Devices | Failed Technical Review and Returned to TF 04/05/2012 | Region of Action- NA |
| 5265A | New Standard: Specifications for Sapphire Wafers Intended for Use for Manufacturing High Brightness-Light Emitting Diode Devices | Failed Procedural Review - Returned to Committee 08/30/2012 | Region of Action- NA |
| 5265B | New Standard: Specifications for Sapphire Wafers Intended for Use for Manufacturing High Brightness-Light Emitting Diode Devices | Published as SEMI HB1-0113 01/25/2013 | Region of Action- NA |
| 5420 | New Standard: Specification for 150 mm Open Plastic and Metal Wafer Cassettes Intended for Use for Manufacturing HB-LED Devices | Failed Technical Review and Returned to TF 07/12/2012 | Region of Action- NA |
| 5420A | New Standard: Specification for 150mm Open Plastic and Metal Wafer Cassettes Intended for Use for Manufacturing HB-LED Devices | Published as SEMI HB2-0613 06/21/2013 | Region of Action- NA |
| 5468 | New Standard: Mechanical Interface Specification for 150 mm HB-LED Load Port | Published as SEMI HB3-1113 11/19/2013 | Region of Action- NA |
| 5469 | New Standard: Specification of Communication Interfaces for High Brightness LED Manufacturing Equipment (HB-LED ECI) | Published as SEMI HB4-0913 09/27/2013 | Region of Action- NA |
| 5684 | Line Item Revisions to SEMI HB1-0113, Specifications for Sapphire Wafers Intended for Use for Manufacturing High Brightness-Light Emitting Diode Devices | See Line Items Below | Region of Action- NA |
5684
LI - 1 | Revisions and Changes in Light Blue Highlight | Published 08/13/2014 | Region of Action- NA |
5684
LI - 2 | Revisions and Changes in Light Green Highlight | Published 08/13/2014 | Region of Action- NA |
5684
LI - 3 | Revisions and Changes in Light Yellow Highlight | Published 08/13/2014 | Region of Action- NA |
| 5741 | Line item revisions to SEMI HB1-0814, Specifications for Sapphire Wafers Intended for Use for Manufacturing High Brightness-Light Emitting Diode Devices | See Line Items Below | Region of Action- NA |
5741
LI - 1 | Update References to Section 3.1 and Table R1-1, Row 2-3.8 and Row 2-3.10 | Passed Technical Review - Awaiting Procedural Review 11/06/2014 | Region of Action- NA |
| 5747 | New Standard: Test Method for Measurement of Saw Marks on Crystalline Sapphire Wafers Using Optical Probes | Drafting 01/08/2015 | Region of Action- NA |
| 5748 | New Standard: Test Method for Measurement of Thickness and Shape of Crystalline Sapphire Wafers Using Optical Probes | Drafting 01/08/2015 | Region of Action- NA |
| 5749 | New Standard: Test Method for Measurement of Waviness of Crystalline Sapphire Wafers Using Optical Probes | Drafting 01/08/2015 | Region of Action- NA |