| 4675A | New Standard: Test Method for the Measurement of Elemental Impurity Concentrations in Silicon Feedstock for Silicon Solar Cells By Bulk Digestion, Inductively Coupled-Plasma Mass Spectrometry | Failed Technical Review and Returned to TF 10/26/2011 | Region of Action- NA |
| 4675B | New Standard: Test Method for the Measurement of Elemental Impurity Concentrations in Silicon Feedstock for Silicon Solar Cells By Bulk Digestion, Inductively Coupled-Plasma Mass Spectrometry | Failed Technical Review and Returned to TF 10/31/2012 | Region of Action- NA |
| 4675C | New Standard: Test Method for the Measurement of Elemental Impurity Concentrations in Silicon Feedstock for Silicon Solar Cells By Bulk Digestion, Inductively Coupled-Plasma Mass Spectrometry | Passed Technical Review - Awaiting Procedural Review 04/03/2013 | Region of Action- NA |
| 4726A | New Standard: Test Methods for Measuring Resistivity or Sheet Resistance with a Single-Sided Noncontact Eddy-Current Gauge | Published as SEMI PV28-0212 02/24/2012 | Region of Action- NA |
| 5095A | New Standard: Specifications for 2-Propanol, Used In Photovoltaic Applications | Published as SEMI PV30-0212 02/10/2012 | Region of Action- NA |
| 5111 | New Standard: Test Method for Spectrally Resolved Reflective and Transmissive Haze of Transparent Conducting Oxide (TCO) Films for PV Application | Published as SEMI PV31-0212 02/24/2012 | Region of Action- NA |
| 5156A | New Standard: Specifications for Hydrogen Peroxide, Used In Photovoltaic Applications | Published as SEMI PV36-0912 09/18/2012 | Region of Action- NA |
| 5157A | New Standard: Specifications for Sulfuric Acid, Used In Photovoltaic Applications | Published as SEMI PV33-0212 02/10/2012 | Region of Action- NA |
| 5158 | New Standard: Specification for Anti-Reflective-Coated Glass, Used in Crystalline Silicon Photovoltaic Modules | Failed Technical Review and Returned to TF 04/04/2012 | Region of Action- NA |
| 5158A | New Standard: Specification for Anti-Reflective-Coated Glass, Used in Crystalline Silicon Photovoltaic Modules | Failed Technical Review and Returned to TF 07/11/2012 | Region of Action- NA |
| 5242 | New Standard: Guide for Fluorine (F2), Used In Photovoltaic Applications | Failed Technical Review and Returned to TF 04/04/2012 | Region of Action- NA |
| 5242A | New Standard: Guide for Fluorine (F2), Used In Photovoltaic Applications | Published as SEMI PV37-0912 09/18/2012 | Region of Action- NA |
| 5330 | New Standard:Test Method for In-Line Measurement of Cracks in PV Silicon Wafers by Dark Field Infrared Imaging | Published as SEMI PV39-0912 09/18/2012 | Region of Action- Europe |
| 5331 | New Standard: Test Method for In-Line Measurement of Saw Marks on PV Silicon Wafers by a Light Sectioning Technique | Failed Technical Review and Returned to TF 03/28/2012 | Region of Action- Europe |
| 5331A | New Standard: Test Method for In-Line Measurement of Saw Marks on PV Silicon Wafers by a Light Sectioning Technique Using Multiple Line Segments | Published as SEMI PV40-0912 09/25/2012 | Region of Action- Europe |
| 5332 | New Standard: Test Method for In-Line, Non-Contact Measurement of Thickness and Thickness Variation of Silicon Wafers for PV Applications Using Capacitive Probes | Failed Technical Review and Returned to TF 03/28/2012 | Region of Action- Europe |
| 5332A | New Standard: Test Method for In-Line, Non-Contact Measurement of Thickness and Thickness Variation of Silicon Wafers for PV Applications Using Capacitive Probes | Published as SEMI PV41-0912 09/18/2012 | Region of Action- Europe |
| 5333 | New Standard: Test Method for In-Line Measurement of Waviness of PV Silicon Wafers by a Light Sectioning Technique Using Multiple Line Segments | Published as SEMI PV42-0113 01/25/2013 | Region of Action- Europe |
| 5334 | Revision of SEMI PV18-0811, Guide for Specifying a Photovoltaic Connector Ribbon | Failed Technical Review and Returned to TF 03/28/2012 | Region of Action- Europe |
| 5334A | Revision of SEMI PV18-0811, Guide for Specifying a Photovoltaic Connector Ribbon | Published 09/25/2012 | Region of Action- Europe |
| 5335 | Revision of SEMI PV19-0811, Guide for Testing Photovoltaic Connector Ribbon Characteristics | Published 07/31/2012 | Region of Action- Europe |
| 5381 | Auxiliary Information: Photovoltaic and Semiconductor Shared Gases and Liquid Chemical Standards | Auxiliary Information Published 07/20/2012 | Region of Action- NA |
| 5387 | Line Items Revision to SEMI PV17-0312, Specification for Virgin Silicon Feedstock Materials for Photovoltaic Applications | See Line Items Below | Region of Action- Europe |
5387
LI - 1 | Add “SEMI PV25, Test Method for Simultaneously Measuring Oxygen, Carbon, Boron and Phosphorous in Solar Silicon Wafers and Feedstock by Secondary Ion Mass Spectrometry” to section 4.1 | Published 10/15/2012 | Region of Action- Europe |
5387
LI - 2 | Replace in Table 1, column “Measurement Methods”, in lines 2.1, 2.2, 2.3 and 2.4 “SIMS” by “PV25”. | Published 10/15/2012 | Region of Action- Europe |
| 5391 | Auxiliary Information: Research Report On Interlaboratory Study To Establish Precision Statements For SEMI PV13, Test Method For Contactless Excess-Charge-Carrier Recombination Lifetime Measurement In Silicon Wafers, Ingots, And Bricks Using An Eddy-Current Sensor | Auxiliary Information Published 10/18/2012 | Region of Action- NA |
| 5394 | New Standard: Test Method for QSS Microwave PCD measurements of Carrier Decay and Lifetime | Drafting 04/12/2012 | Region of Action- NA |
| 5434 | New Standard: Test Method for In-Line Measurement of Lateral Dimensional Characteristics of Square and Pseudo-Square PV Silicon Wafers | Publication Process Started 05/01/2013 | Region of Action- Europe |
| 5436 | Auxiliary Information: Results of Round Robin for SEMI PV10-Test Method for Instrumental Neutron Activation Analysis (INAA) of Silicon | Auxiliary Information Published 02/20/2013 | Region of Action- Europe |
| 5438 | New Standard: Test Method for the Measurement of Oxygen Concentration in PV Silicon Materials for Silicon Solar Cells by Inert Gas Fusion Infrared Detection Method | Published as SEMI PV43-0113 01/31/2013 | Region of Action- NA |
| 5439 | Line Item Revision to SEMI PV13-1111, Test Method for Contactless Excess-Charge-Carrier Recombination Lifetime Measurement in Silicon Wafers, Ingots, and Bricks Using an Eddy-Current Sensor | See Line Items Below | Region of Action- NA |
5439
LI - 1 | Revision proposed here adds references to this study in the Reference Material section and adds a precision statement based on the study to the Uncertainty section. | Passed Technical Review - Awaiting Procedural Review 04/03/2013 | Region of Action- NA |
| 5502 | Line Item Revision to SEMI PV39-0912, Test Method for In-Line Measurement of Cracks in PV Silicon Wafers by Dark Field Infrared Imaging | See Line Items Below | Region of Action- Europe |
5502
LI - 1 | Add note to Figure 1: Camera also may be below the wafer and the projector above the wafer. | Passed Technical Review - Awaiting Procedural Review 03/13/2013 | Region of Action- Europe |
5502
LI - 2 | Remove “in red and” from the heading of Table 2. | Passed Technical Review - Awaiting Procedural Review 03/13/2013 | Region of Action- Europe |
| 5530 | New Standard: Specification for Orientation Fiducial Marks for PV Silicon Wafers | Publication Process Started 05/01/2013 | Region of Action- Europe |
| 5531 | Line Item Revision to SEMI PV40-0912, Test Method for In-Line Measurement of Saw Marks on PV Silicon Wafers by a Light Sectioning Technique Using Multiple Line Segments | See Line Items Below | Region of Action- Europe |
5531
LI - 1 | Replace in § 14.3.5.3 yl,n(x) by yu,n(x) and in §14.3.5.4 yu,n(x) by yl,n(x). | Passed Technical Review - Awaiting Procedural Review 03/13/2013 | Region of Action- Europe |