SEMI International Standards
New Task Forces and Activities


Below you will find a list of recently created Standards task forces and new activities. Please click on a particular task force or document, for more information.

Hide details for Assembly & Packaging CommitteeAssembly & Packaging Committee
SNARF Doc 5835 - New Standard: Specification for Adhesive Tray Used for 3D-IC Manufacturing and Shipping
SNARF Doc 5836 - New Standard: Test Method for Adhesive Strength for Adhesive Tray Used for 3D-IC Manufacturing and Shipping
SNARF Doc 5837 - Reapproval of SEMI G57-0302, Guide for Standardization of Leadframe Terminology
SNARF Doc 5838 - Revision to SEMI G52-90 (Reapproved 1104), Standard Test Method for Measurement of Ionic Contamination on Semiconductor Leadframes (Proposed)
SNARF Doc 5839 - Revision to SEMI G82-0301, PROVISIONAL SPECIFICATION FOR 300 mm TOOL PORT FOR FRAME CASSETTES IN BACKEND PROCESS
Hide details for EH&S CommitteeEH&S Committee
SNARF Doc 5556 - Line Item Revisions to SEMI S2-0712, Environmental, Health, and Safety Guideline for Semiconductor Manufacturing Equipment. Revisions Related to Section 19 Seismic Protection
Hide details for Information & Control CommitteeInformation & Control Committee
SNARF Doc 5828 - Line Item Revision to SEMI E170-0215 “Specification for Production Recipe Cache (PRC)” (Doc. 5730) and SEMI E170.1-0215 “Specification for SECS –II Protocol for Production Recipe Cache (PRC)” (Doc.5731)
SNARF Doc 5829 - Line Item Revision to SEMI E171-mmyy “Specification for Predictive Carrier Logistics (PCL)” (Doc. 5735) and SEMI E171.1-mmyy “Specification for SECS-II Protocol for Predictive Carrier Logistics (PCL)” (Doc. 5778)
SNARF Doc 5832 - New Standard, Specification for Generic Counter Model
SNARF Doc 5833 - New Standard, Specification for Maintenance Program Model
Hide details for Photovoltaic CommitteePhotovoltaic Committee
SNARF Doc 5830 - New Standard: Classification for Electroluminescence Inspection of Crystalline Silicon Photovoltaic Modules
SNARF Doc 5840 - New Standard: Guide for Calibration of PV Module UV Test Chambers
SNARF Doc 5841 - New Standard: Guide for Specifying Low Pressure Horizontal Diffusion Furnace
SNARF Doc 5842 - New Standard: Test Method for Metal-Wrap-Through Solar Cell Via Resistance
SNARF Doc 5843 - Revision of SEMI PV22-1011, Specification for Silicon Wafers for Use in Photovoltaic Solar Cells
Hide details for Silicon Wafer CommitteeSilicon Wafer Committee
SNARF Doc 5834 - Line Item Revision to SEMI M85-1014: Guide for the Measurement of Trace Metal Contamination on Silicon Wafer Surface by Inductively Coupled Plasma Mass Spectrometry


If you have any questions concerning a specifc task force or document, please contact a SEMI Standards staff nearest you.