| | | | | | | |
| 3D Packaging and Integration Committee |
| |
| TFOF | | | | | Wafer Bond Strength Measurement by Double-cantilever Beam Task Force | |
| Automation Technology Committee |
| |
| SNARF | | | | | Doc 7168 - Line Item Revision to SEMI A2-0722 Specification for Surface Mount Assembler Smart Hookup (SMASH) | |
| Compound Semiconductor Materials Committee |
| |
| SNARF | | | | | Doc 7211 - Line Item Revision of SEMI M92-0423 Specification for 4H-SiC Homoepitaxial Wafer | |
| EH&S Committee |
| |
| SNARF | | | | | Doc 7169 - Revision of SEMI S10-0423 Safety Guideline for Risk Assessment and Risk Evaluation Process | |
| Facilities Committee |
| |
| SNARF | | | | | Doc 7205 - Line Item Revision to SEMI F44-0307 (Reapproved 0818), Specification for Machined Stainless Steel Weld Fittings | |
| SNARF | | | | | Doc 7206 - Line Item Revision to SEMI F45-0307 (Reapproved 0818), Specification for Machined Stainless Steel Reducing Weld Fittings | |
| Flat Panel Display (FPD) - Materials & Components Committee |
| |
| SNARF | | | | | Doc 7215 - Reapproval of SEMI D22-0818: Test Method for the Determination of Color, Transmittance of FPD Color Filter Assemblies | |
| SNARF | | | | | Doc 7216 - Reapproval of SEMI D29-0519: Test Method for Heat Resistance in Flat Panel Display Color Filters | |
| SNARF | | | | | Doc 7217 - Reapproval of SEMI SEMI D30-0519: Test Method for Light Resistance in Flat Panel Display Color Filters | |
| SNARF | | | | | Doc 7218 - Reapproval of SEMI D66-0519: Terminology for Plastic Substrates of Flexible Display | |
| SNARF | | | | | Doc 7219 - Reapproval of SEMI D67-0819: Test method for Antifouling Property and Chemical Resistance of FPD Polarizing Films and Its Materials | |
| Flat Panel Display (FPD) - Metrology Committee |
| |
| SNARF | | | | | Doc 7220 - Reapproval of SEMI D59-0519, Terminology for 3D Display | |
| SNARF | | | | | Doc 7221 - Reapproval of SEMI D62-0619, Test Method for Measurement of LED Light Bar for Liquid Crystal Displays | |
| Flexible Hybrid Electronics (FHE) Committee |
| |
| SNARF | | | | | Doc 7193 - New Standard: Guide for Substrate and Interconnect Design of Flexible Hybrid Electronics | |
| SNARF | | | | | Doc 7212 - New Standard: Guide for Inks Characterization for Flexible Hybrid Electronics | |
| FPD - Metrology Committee |
| |
| TFOF | | | | | FPD Metrology Maintenance Task Force | |
| Information & Control Committee |
| |
| SNARF | | | | | Doc 7173 - Line-Item Revision to SEMI E30-0423, SPECIFICATION FOR THE GENERIC MODEL FOR COMMUNICATIONS AND CONTROL OF MANUFACTURING EQUIPMENT (GEM) | |
| SNARF | | | | | Doc 7213 - Line Item Revision to SEMI E142-1022 - Specification for Substrate Mapping, SEMI E142.1-0921E — Specification for XML Schema for Substrate Mapping,
SEMI E142.2-1016 — Specification for SECS II Protocol for Substrate Mapping,
SEMI E142.3-1016 — Specification for Web Services for Substrate Mapping,
SEMI E142.4-1022 — Specification for SECS II Protocol for Substrate Mapping Using Item Transfer | |
| Liquid Chemicals Committee |
| |
| SNARF | | | | | Doc 7214 - Revision of SEMI F41-1116, Guide for Qualification of a Bulk Chemical Distribution System Used in Semiconductor Processing | |
| Photovoltaic Committee |
| |
| SNARF | | | | | Doc 7207 - Reapproval of SEMI PV23-1011 (Reapproved 0818), Test Method for Mechanical Vibration of Crystalline Silicon Photovoltaic (PV) Modules in Shipping Environment | |
| SNARF | | | | | Doc 7208 - Reapproval of SEMI PV38-0912 (Reapproved 0818), Test Method for Mechanical Vibration of c-Si PV Cells in Shipping Environment | |
| SNARF | | | | | Doc 7209 - Reapproval of SEMI PV72-0316, Test Method to Evaluate an Accelerated Thermo Humidity Resistance of Photovoltaic (PV) Encapsulation | |
| SNARF | | | | | Doc 7210 - Reapproval of SEMI PV84-0818, Test Method for Polymer Foil Dependent Discoloration of Silver Fingers on Photovoltaic Modules | |
| Physical Interfaces & Carriers Committee |
| |
| SNARF | | | | | Doc 7170 - Line-Item Revision to SEMI E184 -1221E Specification for 300 mm Tape Frame FOUP Load Port | |
| SNARF | | | | | Doc 7171 - Line-Item Revision to SEMI E185 -1222 Specification for 300 mm Tape Frame FOUP | |
| SNARF | | | | | Doc 7172 - New Standard: Specification for Next Gen Assembly / Test Carrier | |
| TFOF | | | | | Next Gen Assembly / Test Material Handling Task Force | |
| Silicon Wafer Committee |
| |
| SNARF | | | | | Doc 7192 - Revision of SEMI M73-1013E (Reapproved 1019) Test Method for Extracting Relevant Characteristics from Measured Wafer Edge Profiles | |