SEMI International Standards
New Task Forces and Activities


Below you will find a list of recently created Standards task forces and new activities. Please click on a particular task force or document, for more information.

Hide details for Assembly & Packaging CommitteeAssembly & Packaging Committee
SNARF Doc 5835 - New Standard: Specification for Adhesive Tray Used for Thin Chip Handling
SNARF Doc 5836 - New Standard: Test Method for Adhesive Strength for Adhesive Tray Used for Thin Chip Handling
SNARF Doc 5878 - Line Item Revision to SEMI G20-96: SPECIFICATION FOR LEAD FINISHES FOR PLASTIC PACKAGES
SNARF Doc 5879 - Line Item Revision to SEMI G21-94: SPECIFICATION FOR PLATING INTEGRATED CIRCUIT LEADFRAMES
SNARF Doc 5880 - Line Item Revision to SEMI G41-87: SPECIFICATION FOR DUAL STRIP SOIC LEADFRAME
SNARF Doc 5881 - Reapproval of SEMI G83-0912: SPECIFICATION FOR BAR CODE MARKING OF PRODUCT PACKAGES
Hide details for Compound Semiconductor Materials CommitteeCompound Semiconductor Materials Committee
SNARF Doc 5882 - Line Item Revision to SEMI M10-1296, Standard Nomenclature for Identification of Structures and Features Seen on Gallium Arsenide Wafers with title change to: Nomenclature for Identification of Structures and Features Seen on Gallium Arsenide Wafers
Correct nonconforming title per Procedure Manual, Appendix 4
SNARF Doc 5883 - Line Item Revision to SEMI M42-0211, Specification for Compound Semiconductor Epitaxial Wafers
Move DIN standard reference from 'Referenced Standards and Documents' section to a new 'Related Documents' section.
SNARF Doc 5884 - Line Item Revision to SEMI M65-0306E2, Specifications for Sapphire Substrates to use for Compound Semiconductor Epitaxial Wafers with title change to: Specification for Sapphire Substrates to use for Compound Semiconductor Epitaxial Wafers
Correct nonconforming title per Procedure Manual, Appendix 4
SNARF Doc 5885 - Line Item Revision to SEMI M75-0812, Specifications for Polished Monocrystalline Gallium Antimonide Wafers with title change to: Specification for Polished Monocrystalline Gallium Antimonide Wafers
Correct nonconforming title per Procedure Manual, Appendix 4
SNARF Doc 5886 - Line Item Revisions to:
- SEMI M9-0914, Specifications for Polished Monocrystalline Gallium Arsenide Wafers with title change to: Specification for Polished Monocrystalline Gallium Arsenide Wafers
- SEMI M9.1-0813, Standard for Round 50.8 mm Polished Monocrystalline Gallium Arsenide Wafers for Electronic Device Applications with title change to: Specification for Round 50.8 mm Polished Monocrystalline Gallium Arsenide Wafers for Electronic Device Applications
- SEMI M9.2-0813, Standard for Round 76.2 mm Polished Monocrystalline Gallium Arsenide Wafers for Electronic Device Applications with title change to: Specification for Round 76.2 mm Polished Monocrystalline Gallium Arsenide Wafers for Electronic Device Applications
- SEMI M9.5-0813, Standard for Round 100 mm Polished Monocrystalline Gallium Arsenide Wafers for Electronic Device Applications with title change to: Specification for Round 100 mm Polished Monocrystalline Gallium Arsenide Wafers for Electronic Device Applications
- SEMI M9.6-0813, Standard for Round 125 mm Diameter Polished Monocrystalline Gallium Arsenide Wafers with title change to: Specification for Round 125 mm Diameter Polished Monocrystalline Gallium Arsenide Wafers
Correct nonconforming titles per Procedure Manual, Appendix 4
SNARF Doc 5887 - Revision to SEMI M63-0306, Guideline: Test Method for Measuring the Al Fraction in AlGaAs on GaAs Substrates by High Resolution X-Ray Diffraction with title change to: Test Method for Measuring the Al Fraction in AlGaAs on GaAs Substrates by High Resolution X-Ray Diffraction
Major revision to correct nonconforming title per Procedure Manual, Appendix 4
Hide details for EH&S CommitteeEH&S Committee
SNARF Doc 5891 - Revision to SEMI S27, Safety Guideline for the Contents of Environmental, Safety, and Health (ESH) Evaluation Reports
SNARF Doc 5892 - Revisions to SEMI S5-0310, Safety Guideline for Sizing and Identifying Flow Limiting Devices for Gas Cylinder Valves
SNARF Doc 5917 - Line Item Revisions to SEMI S8, Safety Guidelines for Ergonomics Engineering of Semiconductor Manufacturing Equipment. Addition of reference to a manual material-handling guide in SEMI-S8, Appendix 2, Lifting, Strength, and Materials Handling
TFOF SDRCM(S Documents REG-PG-SM Conformance Maintenance) TF
Hide details for Gases CommitteeGases Committee
SNARF Doc 5816 - Revision to SEMI F30-0710 - Start-Up and Verification of Purifier Performance Testing for Trace Gas Impurities and Particles at an Installation Site
Hide details for HB-LED CommitteeHB-LED Committee
SNARF Doc 5916 - Line Item Revisions to HB6-0615, Test Method for Measurement of Thickness and Shape of Crystalline Sapphire Wafers by Using Optical Probes
Hide details for Information & Control CommitteeInformation & Control Committee
SNARF Doc 5829 - Line Item Revision to SEMI E171-0515 “Specification for Predictive Carrier Logistics (PCL)” and SEMI E171.1-0515 “Specification for SECS-II Protocol for Predictive Carrier Logistics (PCL)”
SNARF Doc 5888 - Revision to SEMI E170-mm15 (SEMI Doc. #5828): SPECIFICATION FOR PRODUCTION RECIPE CACHE (PRC) and SEMI E170.1-mm15 (SEMI Doc. #5828): SPECIFICATION FOR SECS-II PROTOCOL FOR PRODUCTION RECIPE CACHE
SNARF Doc 5912 - Line Item Revisions to:
- SEMI E142.1 -0211, XML Schema for Substrate Mapping
- SEMI E142.2-0211, SECS II Protocol for Substrate Mapping
- SEMI E142.3-0211, Web Services for Substrate Mapping
To correct nonconforming titles
SNARF Doc 5913 - Reapproval for SEMI E157-0611, Specification for Module Process Tracking
SNARF Doc 5914 - Reapproval for SEMI E54.3-0698 (Reapproved 1110), Specification for Sensor/Actuator Network Specific Device Model for Mass Flow Device
Hide details for Liquid Chemicals CommitteeLiquid Chemicals Committee
TFOF E49.2 / E49.7 Review/Rewrite
TFOF E49.4 / E49.5 Evaluation
Hide details for Micropatterning CommitteeMicropatterning Committee
SNARF Doc 5906 - Line Item Revision to SEMI P39, OASIS (TM) - Open Artwork System Interchange Standard to correct nonconforming title
SNARF Doc 5907 - Line Item Revision to SEMI P5-0704, Specification for Pellicles to include material for EUV pellicle
SNARF Doc 5908 - Reapproval for SEMI P40, Specification for Mounting Requirements for Extreme Ultraviolet Lithography Masks
SNARF Doc 5909 - Reapproval for SEMI P48, Specification of Fiducial Marks for EUV Mask Blank
Hide details for Photovoltaic CommitteePhotovoltaic Committee
SNARF Doc 5925 - New Standard: Specification for Dual-glass Module with Crystalline Silicon Terrestrial Solar Cell
SNARF Doc 5926 - New Standard:Test Method for Bending Property of Flexible Thin Film PV Modules
SNARF Doc 5927 - Revision of SEMI PV22-1011, Specification for Silicon Wafers for Use in Photovoltaic Solar Cells
Hide details for Photovoltaic (PV) - Materials CommitteePhotovoltaic (PV) - Materials Committee
SNARF Doc 5889 - New Standard: Test Method on cell level for potential-induced degradation susceptibility of solar cells and module encapsulation materials
SNARF Doc 5894 - Line Item Revision to SEMI PV10, Test Method for Instrumental Neutron Activation Analysis (INAA) of Silicon
SNARF Doc 5895 - Line Item Revision of SEMI PV16-0611 Specifications for Nitric Acid, Used in Photovoltaic Applications
SNARF Doc 5896 - Line Item Revision to SEMI PV20-1011 Specifications for Hydrochloric Acid, Used in Photovoltaic Applications
SNARF Doc 5897 - Line Item Revision to SEMI PV27-1011 Specifications for Ammonium Hydroxide, Used in Photovoltaic Applications
SNARF Doc 5898 - Line Item Revision to SEMI PV28-0212 Test Methods for Measuring Resistivity or Sheet Resistance with a Single-Sided Noncontact Eddy-Current Gauge
SNARF Doc 5899 - Line Item Revision to SEMI PV30-0212 Specifications for 2-Propanol, Used in Photovoltaic Applications
SNARF Doc 5900 - Line Item Revision to SEMI PV33-0212 Specifications for Sulfuric Acid, Used in Photovoltaic Applications
SNARF Doc 5901 - Line Item Revision to SEMI PV36-0912 Specifications for Hydrogen Peroxide, Used in Photovoltaic Applications
SNARF Doc 5902 - Reapproval of SEMI PV1-0211   Test Method for Measuring Trace Elements in Silicon Feedstock for Silicon Solar Cells by High-Mass Resolution Glow Discharge Mass Spectrometry
SNARF Doc 5903 - Reapproval of SEMI PV9-0611  Test Method for Excess Charge Carrier Decay in PV Silicon Materials by Non-Contact Measurements of Microwave Reflectance After a Short Illumination Pulse
SNARF Doc 5904 - Reapproval of SEMI PV14-0211  Guide for Phosphorus Oxychloride, Used in Photovoltaic Applications
SNARF Doc 5905 - Reapproval of SEMI PV15-0211  Guide for Defining Conditions for Angle Resolved Light Scatter Measurements to Monitor the Surface Roughness and Texture of PV Materials
TFOF PV Material Degradation Task Force
Hide details for Physical Interfaces & Carriers CommitteePhysical Interfaces & Carriers Committee
SNARF Doc 5928 - Reapproval to SEMI E23-1104, Specification for Cassette Transfer Parallel I/O Interface
Hide details for Silicon Wafer CommitteeSilicon Wafer Committee
SNARF Doc 5804 - Revision of SEMI M53-0310, Practice for Calibrating Scanning Surface Inspection Systems Using Certified Depositions of Monodisperse Reference Spheres on Unpatterned Semiconductor Wafer Surfaces
SNARF Doc 5893 - Revision of SEMI M1-0215 Specifications for Polished Single Crystal Silicon Wafers
SNARF Doc 5910 - Line Item Revision of SEMI M57-0515, Specifications for Silicon Annealed Wafers
SNARF Doc 5911 - Line Item Revision of SEMI M62-0515, Specifications for Silicon Epitaxial Wafers
SNARF Doc 5915 - Line Item Revision to SEMI M1-0215, Addition to Related Information : Illustration of Flatness and Shape Metrics for Silicon Wafers
SNARF Doc 5929 - Line Item Revision to SEMI MF42-1105 (Reapproved 0611) Test Methods for Conductivity Type of Extrinsic Semiconducting Materials
SNARF Doc 5930 - Line Item Revision of SEMI MF43-0705 (Reapproved 0611) Test Methods for Resistivity of Semiconductor Materials
SNARF Doc 5931 - Reapproval of SEMI MF81-1105 (Reapproved 0611) Test Method for Measuring Radial Resistivity Variation on Silicon Wafers
SNARF Doc 5932 - Reapproval of SEMI MF154-1105 (Reapproved 0611) Guide for Identification of Structures and Contaminants Seen on Specular Silicon Surfaces
SNARF Doc 5933 - Line Item Revision of SEMI MF674-0705 (Reapproved 0611) Practice for Preparing Silicon for Spreading Resistance Measurements
SNARF Doc 5934 - Line Item Revision of SEMI MF847-0705 (Reapproved 0611) Test Method for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques
SNARF Doc 5935 - Reapproval of SEMI MF951-0305 (Reapproved 0211) Test Method for Determination of Radial Interstitial Oxygen Variation in Silicon Wafers
SNARF Doc 5936 - Line Item Revision to SEMI MF1152-0305 (Reapproved 0211) Test Methods for Dimensions of Notches on Silicon Wafers
SNARF Doc 5937 - Reapproval of SEMI MF1239-0305 (Reapproved 0211) Test Method for Oxygen Precipitation Characteristics of Silicon Wafers by Measurement of Interstitial Oxygen Reduction
SNARF Doc 5938 - Reapproval of SEMI MF2139-1103 (Reapproved 1110) Test Method for Measuring Nitrogen Concentration in Silicon Substrates by Secondary Ion Mass Spectrometry
SNARF Doc 5939 - Reapproval of SEMI MF1617-0304 (Reapproved 0710) Test Method for Measuring Surface Sodium, Aluminum, Potassium, and Iron on Silicon and EPI Substrates by Secondary Ion Mass Spectrometry
SNARF Doc 5940 - Reapproval of SEMI MF533-0310 Test Method for Thickness and Thickness Variation of Silicon Wafers
Hide details for Traceability CommitteeTraceability Committee
SNARF Doc 5890 - Revision to SEMI T7-0415 Specification for back surface marking of double-side polished wafers with a two-dimensional matrix code symbol
SNARF Doc 5918 - Reapproval of SEMI T12-0710: Specification for Tracing Jigs and Implements
SNARF Doc 5919 - Reapproval of SEMI T13-1104 (Reapproved 0710): Specification for Device Tracking: Concepts, Behavior, and Services
SNARF Doc 5920 - Reapproval of SEMI T16-0310: Specification for Use of Data Matrix Symbology for Automated Identification of Extreme Ultraviolet Lithography Masks
SNARF Doc 5921 - Reapproval of SEMI T19-0311: Specification for Device Marking
SNARF Doc 5922 - Reapproval of SEMI T20-0710: Specification for Authentication of Semiconductors and Related Products
SNARF Doc 5923 - Reapproval of SEMI T8-1110: Specification for Marking of Glass Flat Panel Display Substrates with a Two-dimensional Matrix Code Symbol
SNARF Doc 5924 - Reapproval of SEMI T9-1110: Specification for Marking of Metal Lead-frame Strips with a Two-dimensional Data Matrix Code Symbol


If you have any questions concerning a specifc task force or document, please contact a SEMI Standards staff nearest you.