SEMI International Standards
New Task Forces and Activities


Below you will find a list of recently created Standards task forces and new activities. Please click on a particular task force or document, for more information.

Hide details for Assembly & Packaging CommitteeAssembly & Packaging Committee
SNARF Doc 6027 - Line Item Revision to SEMI G86-0303 (Reapproved 0811): Test Method for Measurement of Chip (Die) Strength by Mean of 3-Point Bending
SNARF Doc 6028 - Line Item Revision to SEMI G97-0116: SPECIFICATION FOR ADHESIVE TRAY USED FOR THIN CHIP HANDLING
SNARF Doc 6029 - Reapproval of SEMI G88-0211: Specification for Tape Frame for 450 mm Wafer
SNARF Doc 6030 - Revision to SEMI G20-96: SPECIFICATION FOR LEAD FINISHES FOR PLASTIC PACKAGES (ACTIVE DEVICES ONLY)
SNARF Doc 6031 - Revision to SEMI G21-0094: SPECIFICATION FOR PLATING INTEGRATED CIRCUIT LEADFRAMES
SNARF Doc 6032 - Revision to SEMI G41-87: SPECIFICATION FOR DUAL STRIP SOIC LEADFRAME
Hide details for Compound Semiconductor Materials CommitteeCompound Semiconductor Materials Committee
SNARF Doc 6015 - Line Item Revision SEMI M81-0611 - Guide to Defects Found in Monocrystalline Silicon Carbide Substrates (5 year review)
Hide details for EH&S CommitteeEH&S Committee
SNARF Doc 5996 - Line Item Revision to S8-0915, Safety Guideline for Ergonomics Engineering of Semiconductor Manufacturing Equipment
SNARF Doc 6049 - Line-Item Revision to SEMI S10-0815E Safety Guideline for Risk Assessment and Risk Evaluation Process
Hide details for Facilities CommitteeFacilities Committee
SNARF Doc 6037 - New Standard: Specification for Power Grid Harmonics Compatibility
TFOF Power Grid Harmonics Task Force
Hide details for Flat Panel Display (FPD) - Materials & Components CommitteeFlat Panel Display (FPD) - Materials & Components Committee
SNARF Doc 6010 - Reapproval of SEMI D34-0710, Test Method for FPD Polarizing Films
SNARF Doc 6011 - Reapproval of SEMI D38-0211, Guide for Quality Area of LCD Masks
SNARF Doc 6012 - Reapproval of SEMI D39-0704 (Reapproved 0710), Specification for Markers on FPD Polarizing
SNARF Doc 6013 - Reapproval of SEMI D6-0211, Specification for Liquid Crystal Display (LCD) Mask Substrates
SNARF Doc 6014 - Revision to SEMI D60-0710: Test Method of Surface Scratch Resistance for FPD Polarizing
Film and Its Materials
Hide details for Gases CommitteeGases Committee
SNARF Doc 5816 - Revision to SEMI F30-0710: Start-Up and Verification of Purifier Performance Testing for Trace Gas Impurities and Particles at an Installation Site
SNARF Doc 5997 - Line Item Revision to SEMI C3-0413, Specifications for Gases
SNARF Doc 5998 - Line Item Revision to SEMI C54-1103 (Reapproved 0211), Specifications and Guidelines for Oxygen
SNARF Doc 5999 - Line Item Revision to SEMI C56-0305 (Reapproved 0211), Specifications and Guidelines for Dichlorosilane (SiH2Cl2)
SNARF Doc 6000 - Line Item Revision to SEMI C57-0305 (Reapproved 0211), Specifications and Guidelines for Argon
SNARF Doc 6001 - Line Item Revision to SEMI C58-1213, Specifications for Hydrogen
SNARF Doc 6002 - Line Item Revision to SEMI C59-1104 (Reapproved 0211), Specifications and Guidelines for Nitrogen
SNARF Doc 6003 - Line Item Revision to SEMI C60-0305 (Reapproved 0211), Specifications and Guidelines for Nitrous Oxide (N2O)
SNARF Doc 6004 - Line Item Revision to SEMI C70-0611, Specifications for Tungsten Hexafluoride (WF6)
Hide details for HB-LED CommitteeHB-LED Committee
SNARF Doc 5016 - Line Item Revision to SEMI HB3-1113, Mechanical Interface Specification for 150 mm HB-LED Load Port
Hide details for Information & Control CommitteeInformation & Control Committee
SNARF Doc 6005 - Line Item Revision to SEMI E30 Generic Model for Communications and Control of Manufacturing Equipment (GEM)
SNARF Doc 6008 - New Auxiliary Information: Equipment Data Acquisition (EDA) Freeze Version Overview
SNARF Doc 6009 - Line Item Revision to Specifications E132, E132.1
SNARF Doc 6020 - Line Item Revision to SEMI E30.1-0309: Inspection and Review Specific Equipment Model (ISEM) to correct nonconforming title
SNARF Doc 6021 - Line Item Revision to SEMI E123-0703 (Reapproved 1109) - Standard for Handler Equipment Specific Equipment Model (HSEM) to correct nonconforming title
SNARF Doc 6022 - Line Item Revision to SEMI E138-0709 - XML Semiconductor Common Components to correct nonconforming title
SNARF Doc 6023 - Line Item Revision to SEMI E122-0703 (Reapproved 1109) - Standard for Tester Equipment Specific Equipment Model (TSEM) to correct nonconforming title
SNARF Doc 6024 - Reapproval of SEMI E30.5-0302 (Reapproved 0308) - Specification for Metrology Specific Equipment Model (MSEM)
SNARF Doc 6025 - Reapproval of SEMI E142-0211 - Specification for Substrate Mapping
SNARF Doc 6026 - Reapproval of SEMI E109-1110 - Specification for Reticle and Pod Management (RPMS)
SNARF Doc 6033 - Line item revision to “SEMI E99-1104E (Reapproved 0710) The Carrier ID Reader/Writer Functional Standard: Specification of Concepts, Behavior, and Services” and
“SEMI E99.1-1104 (Reapproved 0710) Specification for SECS-I and SECS-II Protocol for Carrier ID Reader/Writer Functional Standard”
SNARF Doc 6034 - Reapproval of SEMI E54.21-1110 Specification for Sensor Actuator Network for Motionnet Communication
SNARF Doc 6035 - Line Item Revision to SEMI E91-0600 (Reapproved 1109), Specification for Prober Specific Equipment Model (PSEM)
SNARF Doc 6036 - Reapproval of SEMI E153-0310: Specification for AMHS SEM (AMHS SEM)
SNARF Doc 6038 - Reapproval of SEMI E160-1211:Specification for Communication of Data Quality
Hide details for MEMS / NEMS CommitteeMEMS / NEMS Committee
SNARF Doc 6007 - New Standard: Specification for a Test Pattern for Deep Reactive Ion Etching (DRIE) Process Characterization
SNARF Doc 6018 - New Standard: Specification for Silicon Substrates used in fabrication of MEMS Devices
TFOF MEMS Substrate TF
Hide details for Metrics CommitteeMetrics Committee
SNARF Doc 6017 - Line-item Revision to SEMI E33-1012 Guide for Semiconductor Manufacturing Equipment Electromagnetic Compatibility (EMC)
Hide details for Micropatterning CommitteeMicropatterning Committee
SNARF Doc 6040 - Line Item Revision to SEMI P44-0316 Specification for Open Artwork System Interchange Standard (OASIS ®) Specific to Mask Tools
Hide details for Photovoltaic (PV) - Materials CommitteePhotovoltaic (PV) - Materials Committee
SNARF Doc 5959 - Revision of SEMI PV25-1011 Test Method for Simultaneously Measuring Oxygen, Carbon, Boron And Phosphorus in Solar Silicon Wafers and Feedstock by Secondary Ion Mass Spectrometry
SNARF Doc 5960 - Revision of SEMI PV21-1011 Guide for Silane (SiH4), Used in Photovoltaic Applications
SNARF Doc 5961 - Revision of SEMI PV24-1011 Guide for Ammonia (NH3) in Cylinders, Used in Photovoltaic Applications
SNARF Doc 5962 - Revision of SEMI PV26-1011 Guide for Hydrogen Selenide (H2Se) in Cylinders, Used in Photovoltaic Applications
SNARF Doc 6016 - New Standard: Test Method for Exposure Durability of PV Cells to Acetic Acid Vapor
SNARF Doc 6039 - REAPPROVAL OF SEMI PV31-0212 TEST METHOD FOR SPECTRALLY RESOLVED REFLECTIVE AND TRANSMISSIVE HAZE OF TRANSPARENT CONDUCTING OXIDE (TCO) FILMS FOR PV APPLICATION
Hide details for Silicon Wafer CommitteeSilicon Wafer Committee
SNARF Doc 5993 - Line Item Revision of SEMI M1-0416, Specification for Polished Single Crystal Silicon Wafers
SNARF Doc 5994 - Line Item Revision to SEMI M50, Test Methods for Determining Capture Rate and False Count Rate for Surface Scanning Inspection Systems by the Overlay Method (Fix title for conformance)
SNARF Doc 5995 - Line Item Revision of SEMI MF1048-1111 TEST METHOD FOR MEASURING REFLECTIVE TOTAL INTEGRATED SCATTER
SNARF Doc 6019 - Line item revision of SEMI M1-0416, Specification for Polished Single Crystal Silicon Wafers
SNARF Doc 6041 - Line Item revision of M21-1110 Guide For Assigning Addresses To Rectangular Elements In A Cartesian Array
SNARF Doc 6042 - Line Item Revision to SEMI MF1763-0706 (Reapproved 1111)Test Methods for Measuring Contrast of a Linear Polarizer
(Title correction for conformance)
SNARF Doc 6043 - Line Item Revision to SEMI MF28-0707 (Reapproved 0912) Test Methods for Minority Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay
(Title correction for conformance)
SNARF Doc 6044 - Line Item Revision to SEMI MF673-1014 Test Methods For Measuring Resistivity Of Semiconductor Wafers Or Sheet Resistance Of Semiconductor Films With A Noncontact Eddy-current Gauge
(Title correction for conformance)
SNARF Doc 6045 - Line Item Revision to SEMI MF928-1014 Test Methods For Edge Contour Of Circular Semiconductor Wafers And Rigid Disk Substrates
(Title correction for conformance)
SNARF Doc 6046 - Line Item Revision to SEMI MF1982-0714 Test Methods For Analyzing Organic Contaminants On Silicon Wafer Surfaces By Thermal Desorption Gas Chromatography
(Title correction for conformance)
SNARF Doc 6047 - Reapproval of SEMI MF728-1106 (Reapproved 1111) Practice for Preparing an Optical Microscope for Dimensional Measurements
SNARF Doc 6048 - Reapproval of SEMI MF978-1106 (Reapproved 1111)Test Method for Characterizing Semiconductor Deep Levels by Transient Capacitance Techniques


If you have any questions concerning a specifc task force or document, please contact a SEMI Standards staff nearest you.