SEMI International Standards
New Task Forces and Activities


Below you will find a list of recently created Standards task forces and new activities. Please click on a particular task force or document, for more information.

Hide details for 3DS-IC Committee3DS-IC Committee
SNARF Doc 5506 - New Standard: Guide for Measuring Flatness and Shape of Low Stiffness Wafers
SNARF Doc 5766 - New Auxiliary Information to accompany SEMI Document 5270: New Standard: Guide for Measuring Voids in Bonded Wafer Stacks
Hide details for Assembly & Packaging CommitteeAssembly & Packaging Committee
SNARF Doc 5753 - Reapproval of SEMI G74-0699 (Reapproved 0706) - Specification for Tape Frame for 300 mm Wafers
SNARF Doc 5754 - Reapproval of SEMI G77-0699 (Reapproved 0706) - Specification for Frame Cassette for 300 mm Wafers
SNARF Doc 5755 - Reapproval of SEMI G81-0307 Specification for Map Data Items
SNARF Doc 5756 - Reapproval of SEMI G81.1-0307 - Specification of Grand Concept of Map Data for Characteristics of Dice on Substrate
SNARF Doc 5757 - Reapproval of SEMI G87-1108 Specification for Plastic Tape Frame for 300 mm Wafer
SNARF Doc 5780 - Reapproval of G75-0698 (Reapproved 0706) Standard Test Method of the Properties of Leadframe Tape
SNARF Doc 5781 - Reapproval of G75.01-0698 (Reapproved 0706)Test Method for Measurement of Ionic Impurities in Leadframe Tape
SNARF Doc 5782 - Reapproval of G75.02-0698 (Reapproved 0706)Test Method for Measurment of Adhesive Strength of Leadframe Tape
SNARF Doc 5783 - Reapproval of G75.03-0698 (Reapproved 0706) Test Method for Measurment of The Peel Strength of Protective Film on Leadframe Tape
SNARF Doc 5784 - Reapproval of G75.04-0698 (Reapproved 0706) Test Method for Measurment of Water Absorption of Leadframe Tape
SNARF Doc 5785 - Reapproval of G75.05-0698 (Reapproved 0706) Test Method for Measurment of Weight Loss of Leadframe Tape
SNARF Doc 5786 - Reapproval of G75.06-0698 (Reapproved 0706) Test Method for Measurment of the Shrinkage Factor of Leadframe Tape
SNARF Doc 5787 - Reapproval of G75.07-0698 (Reapproved 0706) Test Method for Measurment of Thermal Decomposition Temperature of Leadframe Tape and Aehesive
SNARF Doc 5788 - Reapproval of G75.08-0698 (Reapproved 0706) Test Method for Measurment of the Coefficient of Thermal Expansion and Glass Transition Temperature of Leadframe Tape
SNARF Doc 5789 - Reapproval of G75.09-0698 (Reapproved 0706) Test Method for Measurment of Tensile Strength
SNARF Doc 5790 - Reapproval of G75.10-0698 (Reapproved 0706) Test Method for Measurment of Volume and Surface Resistivity of the Leadframe Tape
SNARF Doc 5791 - Reapproval of G75.11-0698 (Reapproved 0706) Test Method for Measurment of the Dielectric Constant and Dissipation Factor of the Leadframe Tape
SNARF Doc 5792 - Reapproval of G75.12-0698 (Reapproved 0706) Test Method for Measurment of Breakdown Strength of Leadframe Tape
SNARF Doc 5793 - Reapproval of G75.13-0698 (Reapproved 0706) Test Method for Measurment of the Leakage Current in Leadframe Tape
Hide details for Compound Semiconductor Materials CommitteeCompound Semiconductor Materials Committee
TFOF Task Force for Reapproval of SEMI M63-0306, M46-1101E (reapproved 0309), and M64-0306
Hide details for EH&S CommitteeEH&S Committee
SNARF Doc 5760 - Line Item Revisions to SEMI S7, Safety Guideline for Evaluating Personnel and Evaluating Company Qualifications
SNARF Doc 5761 - New Standard: EHS Guideline for Use of Energetic Materials in Semiconductor R&D and Manufacturing Processes
TFOF Energetic Materials EHS Task Force
TFOF S7 Task Force
Hide details for HB-LED CommitteeHB-LED Committee
SNARF Doc 5741 - Line item revisions to SEMI HB1-0814, Specifications for Sapphire Wafers Intended for Use for Manufacturing High Brightness-Light Emitting Diode Devices
SNARF Doc 5747 - New Standard: Test Method for Measurement of Saw Marks on Crystalline Sapphire Wafers Using Optical Probes
SNARF Doc 5748 - New Standard: Test Method for Measurement of Thickness and Shape of Crystalline Sapphire Wafers Using Optical Probes
SNARF Doc 5749 - New Standard: Test Method for Measurement of Waviness of Crystalline Sapphire Wafers Using Optical Probes
SNARF Doc 5775 - New Standard: Specification for Sapphire Single Crystal Ingot Intended for Use for Manufacturing HB-LED Wafers
SNARF Doc 5776 - New Standard: Test Method for Detecting Surface Defects of GaN based LED Epitaxial Wafer Used for Manufacturing HB-LED
TFOF GaN based LED Epitaxial Wafer Task Force
TFOF Sapphire Single Crystal Ingot Task Force
TFOF Test Methods TF
Hide details for Information & Control CommitteeInformation & Control Committee
SNARF Doc 4946 - Line Item Revision to SEMI E87-0709, Specification for Carrier Management (CMS), Adding Carrier Ready to Unload Prediction Feature
SNARF Doc 5619 - New Standard: Specification for SECS Equipment Data Dictionary (SEDD)
SNARF Doc 5730 - Line Item Revision to SEMI E170-0714, Specification for Production Recipe Cache (PRC)
SNARF Doc 5731 - Revision to add a New Subordinate Standard “Specification for SECS-II Protocol for Production Recipe Cache” to SEMI E170-0714 “Specification for Production Recipe Cache (PRC)”
SNARF Doc 5735 - Line Item Revision to SEMI E171-0914: Specification for Predictive Carrier Logistics (PCL)
SNARF Doc 5738 - Revision to E87.1, Specification for SECS-II Protocol for Carrier Management (CMS)
SNARF Doc 5762 - Revision to SEMI E132, Specification for Equipment Client Authentication and Authorization. Adding EDA freeze versions to E132
SNARF Doc 5763 - Reapproval for SEMI E30.5, Specification for Metrology Specific Equipment Model (MSEM)
SNARF Doc 5764 - Reapprovals for SEMI E130, Specification for Prober Specific Equipment Model for 300 mm Environment (PSEM300) and SEMI E130.1, Specification for SECS-II Protocol for Prober Specific Equipment Model for 300 mm Environment (PSEM300)
SNARF Doc 5778 - Revision to add a New Subordinate Standard for Specification for SECS-II Protocol for SEMI E171-0914 Specification for Predictive Carrier Logistics
SNARF Doc 5779 - Revision to SEMI E169-0414 Guide for Equipment Information System Security
Hide details for Liquid Chemicals CommitteeLiquid Chemicals Committee
SNARF Doc 5657 - Revision to SEMI C66-0308, Guide for Trimethylaluminium (TMAI), 99.5% Quality
Hide details for Metrics CommitteeMetrics Committee
SNARF Doc 5750 - Revision to Add a New Subordinate Standard: Specification for Product Time Measurement for Material Control Systems to SEMI E168-XX14, Specification for Product Time Measurement
SNARF Doc 5751 - Revision to Add a New Subordinate Standard: Specification for Product Time Measurement for Transport Systems to SEMI E168-XX14, Specification for Product Time Measurement
Hide details for Photovoltaic CommitteePhotovoltaic Committee
SNARF Doc 5739 - New Standard: Test Method to Evaluate an Accelerated Thermo Humidity Resistance of PV Encapsulants
SNARF Doc 5740 - New Standard: Test method of electrochemical corrosion for PV module
SNARF Doc 5767 - New Standard: Guide for Material Requirements of Internal Feeders Used in Mono-crystal Silicon Growers
SNARF Doc 5768 - New Standard: Specification for Testing Requirements of Electroluminescence Defect Detection System for Crystalline Silicon PV Modules
SNARF Doc 5773 - New Standard: Test Method for Cell Defects in Crystalline Silicon PV Modules by Using Electroluminescence
Hide details for Physical Interfaces & Carriers CommitteePhysical Interfaces & Carriers Committee
SNARF Doc 5758 - Revision to SEMI AUX023-0614, Overview Guide to SEMI Standards for 450 mm Wafers
SNARF Doc 5759 - Revision to SEMI E83-0714, Specification for PGV Mechanical Docking Flange
SNARF Doc 5777 - Reapproval of SEMI E92-0302E, Specification for 300 mm Light Weight and Compact Box Opener/Loader to Tool-Interoperability Standard (Bolts/Light)
Hide details for Silicon Wafer CommitteeSilicon Wafer Committee
SNARF Doc 5403 - Withdrawal of SEMI MF534-0707 Test Method for Bow of Silicon Wafers
SNARF Doc 5742 - Line Item Revision to M62-0414 Specifications For Silicon Epitaxial Wafers
SNARF Doc 5743 - Line Item Revision to SEMI M1-0414, Specification for Polished Single Crystal Silicon Wafer
SNARF Doc 5744 - Line Item Revision to SEMI M49-0613 - Guide for Specifying Geometry Measurement Systems for Silicon Wafers for the 130 nm to 16 nm Technology Generations (Re: to clarify and better define exclusion windows)
SNARF Doc 5745 - New Standard: Guide for Wafer Dimensional Metrology Based on Areal Image Acquisition Technology
SNARF Doc 5746 - Reapproval of SEMI ME1392-1109, Guide for Angle Resolved Optical Scatter Measurements on Specular or Diffuse Surfaces
SNARF Doc 5769 - New Standard: Test Method for Nitrogen Content in Silicon by Infrared Absorption
SNARF Doc 5770 - New Standard: Test Method for Bulk Micro Defect Density and Denuded Zone Width in Annealed Silicon Wafers
SNARF Doc 5771 - Revision to SEMI M80-0514, Mechanical Specification for Front-Opening Shipping Box used to Transport and Ship 450 mm Wafers with Title Change to Specification for Front-Opening Shipping Box used to Transport and Ship 450mm Wafers
SNARF Doc 5772 - Revision of MF391-0310: Test Methods for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-state Surface photovoltage
SNARF Doc 5774 - New Standard: Sample Preparation Method for Minority Carrier Diffusion Length Measurement in Silicon Wafers by Surface Photovoltage Method
SNARF Doc 5794 - New Standard: Specification Of Developmental 450mm Diameter Polished Single Crystal Notchless Silicon Wafers With Back Surface Fiducial Marks
Hide details for Traceability CommitteeTraceability Committee
SNARF Doc 5752 - Revision of SEMI T7-0303 (Reapproved 0709), Specification for Back Surface Marking of Double-Side Polished Wafers with a Two-Dimensional Matrix Code Symbol


If you have any questions concerning a specifc task force or document, please contact a SEMI Standards staff nearest you.