SEMI International Standards
New Task Forces and Activities


Below you will find a list of recently created Standards task forces and new activities. Please click on a particular task force or document, for more information.

Show details for 3DS-IC Committee3DS-IC Committee
Show details for Assembly & Packaging CommitteeAssembly & Packaging Committee
Show details for Compound Semiconductor Materials CommitteeCompound Semiconductor Materials Committee
Show details for EH&S CommitteeEH&S Committee
Show details for Flat Panel Display (FPD) - Metrology CommitteeFlat Panel Display (FPD) - Metrology Committee
Show details for HB-LED CommitteeHB-LED Committee
Show details for Information & Control CommitteeInformation & Control Committee
Show details for Liquid Chemicals CommitteeLiquid Chemicals Committee
Show details for Metrics CommitteeMetrics Committee
Show details for Photovoltaic CommitteePhotovoltaic Committee
Show details for Physical Interfaces & Carriers CommitteePhysical Interfaces & Carriers Committee
Hide details for Silicon Wafer CommitteeSilicon Wafer Committee
SNARF Doc 5403 - Withdrawal of SEMI MF534-0707 Test Method for Bow of Silicon Wafers
SNARF Doc 5736 - Line Item Revision to M41-1213 Specification of Silicon-on-Insulator (SOI) for Power Device/ICs
SNARF Doc 5737 - Revision of SEMI MF1391-1107, Test Method for Substitutional Atomic Carbon Content of Silicon by Infrared Absorption
SNARF Doc 5742 - Line Item Revision to M62-0414 Specifications For Silicon Epitaxial Wafers
SNARF Doc 5743 - Line Item Revision to SEMI M1-0414, Specification for Polished Single Crystal Silicon Wafer
SNARF Doc 5744 - Line Item Revision to SEMI M49-0613 - Guide for Specifying Geometry Measurement Systems for Silicon Wafers for the 130 nm to 16 nm Technology Generations (Re: to clarify and better define exclusion windows)
SNARF Doc 5745 - New Standard: Guide for Wafer Dimensional Metrology Based on Areal Image Acquisition Technology
SNARF Doc 5746 - Reapproval of SEMI ME1392-1109, Guide for Angle Resolved Optical Scatter Measurements on Specular or Diffuse Surfaces
SNARF Doc 5769 - New Standard: Test Method for Nitrogen Content in Silicon by Infrared Absorption
SNARF Doc 5770 - New Standard: Test Method for Bulk Micro Defect Density and Denuded Zone Width in Annealed Silicon Wafers
SNARF Doc 5771 - Revision to SEMI M80-0514, Mechanical Specification for Front-Opening Shipping Box used to Transport and Ship 450 mm Wafers with Title Change to Specification for Front-Opening Shipping Box used to Transport and Ship 450mm Wafers
SNARF Doc 5772 - Revision of MF391-0310: Test Methods for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-state Surface photovoltage
SNARF Doc 5774 - New Standard: Sample Preparation Method for Minority Carrier Diffusion Length Measurement in Silicon Wafers by Surface Photovoltage Method
Show details for Traceability CommitteeTraceability Committee


If you have any questions concerning a specifc task force or document, please contact a SEMI Standards staff nearest you.