SEMI International Standards
New Task Forces and Activities


Below you will find a list of recently created Standards task forces and new activities. Please click on a particular task force or document, for more information.

Show details for 3D Packaging and Integration Committee3D Packaging and Integration Committee
Show details for Automation Technology CommitteeAutomation Technology Committee
Show details for EH&S CommitteeEH&S Committee
Show details for Facilities CommitteeFacilities Committee
Show details for Flat Panel Display (FPD) - Metrology CommitteeFlat Panel Display (FPD) - Metrology Committee
Show details for Gases CommitteeGases Committee
Show details for Information & Control CommitteeInformation & Control Committee
Show details for Liquid Chemicals CommitteeLiquid Chemicals Committee
Show details for Metrics CommitteeMetrics Committee
Show details for Micropatterning CommitteeMicropatterning Committee
Show details for Physical Interfaces & Carriers CommitteePhysical Interfaces & Carriers Committee
Hide details for Silicon Wafer CommitteeSilicon Wafer Committee
SNARF Doc 6205 - Line Item Revision to SEMI M43, Guide for Reporting Wafer Nanotopgraphy
SNARF Doc 6206 - Line Item Revision to SEMI M78, Guide for Determining Nanotopography of Unpatterned Silicon Wafers for the 130 nm to 22 nm Generations in High Volume Manufacturing
SNARF Doc 6207 - Line Items Revision to SEMI M1-1016, Specification for Polished Single Crystal Silicon Wafers (Add Shape metrics of Bow 3p in appendix 2 which was mistakenly removed at previous ballot, and add Illustrations of Shape Metrics for Silicon Wafers in Appendix 2.)
Show details for Traceability CommitteeTraceability Committee


If you have any questions concerning a specifc task force or document, please contact a SEMI Standards staff nearest you.