SEMI International Standards
New Task Forces and Activities


Below you will find a list of recently created Standards task forces and new activities. Please click on a particular task force or document, for more information.

Show details for Assembly & Packaging CommitteeAssembly & Packaging Committee
Show details for Compound Semiconductor Materials CommitteeCompound Semiconductor Materials Committee
Show details for EH&S CommitteeEH&S Committee
Show details for Gases CommitteeGases Committee
Show details for HB-LED CommitteeHB-LED Committee
Show details for Information & Control CommitteeInformation & Control Committee
Show details for Liquid Chemicals CommitteeLiquid Chemicals Committee
Show details for Micropatterning CommitteeMicropatterning Committee
Show details for Photovoltaic CommitteePhotovoltaic Committee
Show details for Photovoltaic (PV) - Materials CommitteePhotovoltaic (PV) - Materials Committee
Show details for Physical Interfaces & Carriers CommitteePhysical Interfaces & Carriers Committee
Hide details for Silicon Wafer CommitteeSilicon Wafer Committee
SNARF Doc 5804 - Revision of SEMI M53-0310, Practice for Calibrating Scanning Surface Inspection Systems Using Certified Depositions of Monodisperse Reference Spheres on Unpatterned Semiconductor Wafer Surfaces
SNARF Doc 5893 - Revision of SEMI M1-0215 Specifications for Polished Single Crystal Silicon Wafers
SNARF Doc 5910 - Line Item Revision of SEMI M57-0515, Specifications for Silicon Annealed Wafers
SNARF Doc 5911 - Line Item Revision of SEMI M62-0515, Specifications for Silicon Epitaxial Wafers
SNARF Doc 5915 - Line Item Revision to SEMI M1-0215, Addition to Related Information : Illustration of Flatness and Shape Metrics for Silicon Wafers
SNARF Doc 5929 - Line Item Revision to SEMI MF42-1105 (Reapproved 0611) Test Methods for Conductivity Type of Extrinsic Semiconducting Materials
SNARF Doc 5930 - Line Item Revision of SEMI MF43-0705 (Reapproved 0611) Test Methods for Resistivity of Semiconductor Materials
SNARF Doc 5931 - Reapproval of SEMI MF81-1105 (Reapproved 0611) Test Method for Measuring Radial Resistivity Variation on Silicon Wafers
SNARF Doc 5932 - Reapproval of SEMI MF154-1105 (Reapproved 0611) Guide for Identification of Structures and Contaminants Seen on Specular Silicon Surfaces
SNARF Doc 5933 - Line Item Revision of SEMI MF674-0705 (Reapproved 0611) Practice for Preparing Silicon for Spreading Resistance Measurements
SNARF Doc 5934 - Line Item Revision of SEMI MF847-0705 (Reapproved 0611) Test Method for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques
SNARF Doc 5935 - Reapproval of SEMI MF951-0305 (Reapproved 0211) Test Method for Determination of Radial Interstitial Oxygen Variation in Silicon Wafers
SNARF Doc 5936 - Line Item Revision to SEMI MF1152-0305 (Reapproved 0211) Test Methods for Dimensions of Notches on Silicon Wafers
SNARF Doc 5937 - Reapproval of SEMI MF1239-0305 (Reapproved 0211) Test Method for Oxygen Precipitation Characteristics of Silicon Wafers by Measurement of Interstitial Oxygen Reduction
SNARF Doc 5938 - Reapproval of SEMI MF2139-1103 (Reapproved 1110) Test Method for Measuring Nitrogen Concentration in Silicon Substrates by Secondary Ion Mass Spectrometry
SNARF Doc 5939 - Reapproval of SEMI MF1617-0304 (Reapproved 0710) Test Method for Measuring Surface Sodium, Aluminum, Potassium, and Iron on Silicon and EPI Substrates by Secondary Ion Mass Spectrometry
SNARF Doc 5940 - Reapproval of SEMI MF533-0310 Test Method for Thickness and Thickness Variation of Silicon Wafers
Show details for Traceability CommitteeTraceability Committee


If you have any questions concerning a specifc task force or document, please contact a SEMI Standards staff nearest you.