EVENTS & TRADE SHOWS
SEMI International Standards
New Task Forces and Activities
Below you will find a list of recently created Standards task forces and new activities. Please click on a particular task force or document, for more information.
Automation Technology Committee
Compound Semiconductor Materials Committee
Flat Panel Display (FPD) - Materials & Components Committee
Flat Panel Display (FPD) - Metrology Committee
Information & Control Committee
Liquid Chemicals Committee
Photovoltaic (PV) - Materials Committee
Physical Interfaces & Carriers Committee
Silicon Wafer Committee
Doc 6096 - Line Item Revision to SEMI M53-0216 Practice for Calibrating Scanning Surface Inspection Systems Using Certified Depositions of Monodispere Reference Spheres on Unpatterned Semiconductor Wafer Surfaces (Addition of a related information section to SEMI M53 regarding the relationship of calibrated sizes assigned to defects by surface inspection systems to their actual physical size )
Doc 6097 - Line Item Revision to SEMI M1-0416 Specification for Polished Single Crystal Silicon Wafers, to address issues with primary fiducials across text, table and figures.
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contact a SEMI Standards staff
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