SEMI International Standards
New Task Forces and Activities


Below you will find a list of recently created Standards task forces and new activities. Please click on a particular task force or document, for more information.

Show details for 3DS-IC Committee3DS-IC Committee
Show details for Assembly & Packaging CommitteeAssembly & Packaging Committee
Show details for Flat Panel Display (FPD) - Materials & Components CommitteeFlat Panel Display (FPD) - Materials & Components Committee
Show details for Gases CommitteeGases Committee
Hide details for HB-LED CommitteeHB-LED Committee
SNARF Doc 5775 - New Standard: Specification for Sapphire Single Crystal Ingot Intended for Use for Manufacturing HB-LED Wafers
SNARF Doc 5776 - New Standard: Test Method for Detecting Surface Defects of GaN based LED Epitaxial Wafer Used for Manufacturing HB-LED
SNARF Doc 5818 - Line Items Revision to SEMI HB1-XXXX, Specifications for Sapphire Wafers Intended for Use for Manufacturing High Brightness-Light Emitting Diode Devices
TFOF GaN based LED Epitaxial Wafer Task Force
TFOF HB-LED Source Materials TF
TFOF Sapphire Single Crystal Ingot Task Force
Show details for Information & Control CommitteeInformation & Control Committee
Show details for Liquid Chemicals CommitteeLiquid Chemicals Committee
Show details for MEMS / NEMS CommitteeMEMS / NEMS Committee
Show details for Metrics CommitteeMetrics Committee
Show details for Photovoltaic CommitteePhotovoltaic Committee
Show details for Photovoltaic (PV) - Materials CommitteePhotovoltaic (PV) - Materials Committee
Show details for Physical Interfaces & Carriers CommitteePhysical Interfaces & Carriers Committee
Show details for Silicon Wafer CommitteeSilicon Wafer Committee


If you have any questions concerning a specifc task force or document, please contact a SEMI Standards staff nearest you.