SEMI International Standards
New Task Forces and Activities
Below you will find a list of recently created Standards task forces and new activities. Please click on a particular task force or document, for more information.
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 | 3DS-IC Committee |
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 | Assembly & Packaging Committee |
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 | Compound Semiconductor Materials Committee |
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 | EH&S Committee |
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 | Facilities Committee |
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 | Flat Panel Display (FPD) - Materials & Components Committee |
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 | Flat Panel Display (FPD) - Metrology Committee |
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 | Gases Committee |
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 | Information & Control Committee |
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| SNARF | | | | | Doc 5411 - New Standard: Specification for Equipment Energy Saving Mode Communications (EESM) |  |
| SNARF | | | | | Doc 5549 - Revision to SEMI E30, Generic Model for Communications and Control of Manufacturing Equipment (GEM) with title change to: Specification for the Generic Model for Communications and Control of Manufacturing Equipment (GEM) |  |
| SNARF | | | | | Doc 5589 - Revisions to:
- SEMI E30, Generic Model for Communications and Control of Manufacturing Equipment (GEM),
- SEMI E30.1, Inspection and Review Specific Equipment Model (ISEM),
- SEMI E82, Specification for Interbay/Intrabay AMHS SEM (IBSEM),
- SEMI E88, Specification for AMHS Storage SEM (Stocker SEM),
- SEMI E91, Specification for Prober Specific Equipment Model (PSEM),
- SEMI E122, Standard for Tester Equipment Specific Equipment Model (TSEM), and
- SEMI E123.1, Specification for SECS-II Protocol for Handler Specific Equipment Model (HSEM) |  |
 | MEMS / NEMS Committee |
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 | Metrics Committee |
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 | Micropatterning Committee |
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 | Photovoltaic Committee |
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 | Photovoltaic (PV) - Automation Committee |
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 | Photovoltaic (PV) - Materials Committee |
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 | Physical Interfaces & Carriers Committee |
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 | Silicon Wafer Committee |
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 | Traceability Committee |
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If you have any questions concerning a specifc task force or document, please contact a SEMI Standards staff nearest you.
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