SEMI International Standards
New Task Forces and Activities


Below you will find a list of recently created Standards task forces and new activities. Please click on a particular task force or document, for more information.

Show details for 3DS-IC Committee3DS-IC Committee
Show details for Assembly & Packaging CommitteeAssembly & Packaging Committee
Show details for Compound Semiconductor Materials CommitteeCompound Semiconductor Materials Committee
Show details for EH&S CommitteeEH&S Committee
Show details for Flat Panel Display (FPD) - Materials & Components CommitteeFlat Panel Display (FPD) - Materials & Components Committee
Show details for Flat Panel Display (FPD) - Metrology CommitteeFlat Panel Display (FPD) - Metrology Committee
Show details for Gases CommitteeGases Committee
Show details for HB-LED CommitteeHB-LED Committee
Hide details for Information & Control CommitteeInformation & Control Committee
SNARF Doc 4946 - Line Item Revision to SEMI E87-0709, Specification for Carrier Management (CMS), Adding Carrier Ready to Unload Prediction Feature
SNARF Doc 5619 - New Standard: Specification for SECS Equipment Data Dictionary (SEDD)
SNARF Doc 5716 - Revisions to SEMI E133, Specification for Automated Process Control Systems Interface and SEMI E133.1, Provisional Specification for XML Messaging for Process Control Systems (PCS)
SNARF Doc 5730 - Line Item Revision to SEMI EXX-XXXX (5538A), Specification for Production Recipe Cache
SNARF Doc 5731 - Revision to add a New Subordinate Standard “Specification for SECS-II Protocol for Production Recipe Cache” to Exxx (SEMI Doc. #5538A) “Specification for Production Recipe Cache(PRC)”
SNARF Doc 5735 - Line Item Revision to SEMI EXXX-XXXX (5486A): Specification for Predictive Carrier Logistics
SNARF Doc 5738 - Revision to E87.1, Specification for SECS-II Protocol for Carrier Management (CMS)
SNARF Doc 5762 - Revision to SEMI E132, Specification for Equipment Client Authentication and Authorization. Adding EDA freeze versions to E132
SNARF Doc 5763 - Reapproval for SEMI E30.5, Specification for Metrology Specific Equipment Model (MSEM)
SNARF Doc 5764 - Reapprovals for SEMI E130, Specification for Prober Specific Equipment Model for 300 mm Environment (PSEM300) and SEMI E130.1, Specification for SECS-II Protocol for Prober Specific Equipment Model for 300 mm Environment (PSEM300)
Show details for Liquid Chemicals CommitteeLiquid Chemicals Committee
Show details for Metrics CommitteeMetrics Committee
Show details for Photovoltaic CommitteePhotovoltaic Committee
Show details for Physical Interfaces & Carriers CommitteePhysical Interfaces & Carriers Committee
Show details for Silicon Wafer CommitteeSilicon Wafer Committee
Show details for Traceability CommitteeTraceability Committee


If you have any questions concerning a specifc task force or document, please contact a SEMI Standards staff nearest you.