SEMI International Standards
SEMI New Activity Report Forms (SNARFs)
& SEMI Task Force Organization Forms (TFOFs)
Below you will find the TFOFs of all the task forces actively working in each region. The TFOF contains the charter and purpose of each task force.
The SNARFs that are listed under each task force are the individual activities of the task force. While the majority of these activities lead to the creation or revision of a standard, there are some activities which are focused on exploring and expanding the program.
If you have any further questions on a specific activity, contact your local Standards staff. A listing of global SEMI Standards staff can be found on the contact information page.
Blank forms:
TFOF (DOC 115K) (Feb 2024)
SNARF (DOC 133K) (Apr 2024)
The listing of SNARFs and TFOFs below are sorted by Global Technical Committee, and then by the region that approved the TFOF.
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| 3D Packaging and Integration |
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| Japan |
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| North America |
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| 3DP&I Bonded Wafer Stacks Task Force |
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| 3DP&I Inspection and Metrology Task Force |
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| | | 7099 | | Revision to SEMI 3D3-0613 (Reapproved 1218), Guide for Multiwafer Transport and Storage Containers for 300 mm, Thin Silicon Wafers on Tape Frames | |
| | | 7100 | | Revision to SEMI 3D4-0915 (Reapproved 0222), Guide for Metrology for Measuring Thickness, Total Thickness Variation (TTV), Bow, Warp/Sori, and Flatness of Bonded Wafer Stacks | |
| | | 7101 | | Revision to SEMI 3D5-0314 (Reapproved 1218), Guide for Metrology Techniques to be Used in Measurement of Geometrical Parameters of Through-Silicon Vias (TSVs) in 3DS-IC Structures | |
| | | 7102 | | Revision to SEMI 3D17-1217, Specification for Reference Material for Bonded Wafer Stack Void Metrology | |
| | | TFOF | | 3DP&I Inspection and Metrology Task Force | |
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| Panel Level Packaging (PLP) Panel Task Force |
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| Taiwan |
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| Automated Test Equipment |
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| Automation Technology |
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| Compound Semiconductor Materials |
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| EH&S |
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| Facilities |
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| Flat Panel Display (FPD) - Materials & Components |
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| Flat Panel Display (FPD) - Metrology |
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| Flexible Hybrid Electronics (FHE) |
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| FPD - Metrology |
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| Gases |
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| HB-LED |
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| Information & Control |
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| Liquid Chemicals |
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| MEMS / NEMS |
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| Metrics |
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| Micropatterning |
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| Photovoltaic |
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| Photovoltaic (PV) - Materials |
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| Physical Interfaces & Carriers |
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| Silicon Wafer |
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| Traceability |
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