 |  |  | | | | |
 | 3D Packaging and Integration |
| |
 | Automated Test Equipment |
| |
 | Automation Technology |
| |
 | Compound Semiconductor Materials |
| |
 | EH&S |
| |
 | Facilities |
| |
 | Flat Panel Display (FPD) - Materials & Components |
| |
 | Flat Panel Display (FPD) - Metrology |
| |
 | Flexible Hybrid Electronics (FHE) |
| |
 | Gases |
| |
 | HB-LED |
| |
 | Information & Control |
| |
|
 | China |
| |
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 | Japan |
| |
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 | Korea |
| |
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 | North America |
| |
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 | Advanced Backend Factory Integration |
| |
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 | Diagnostic Data Acquisition Task Force NA |
| |
| | | 6343 | | Line-Item Revision to SEMI E138: Specification for XML Semiconductor Common Components |  |
| | | 6345 | | Revision to Add a New Subordinate Standard: Specification for Protocol Buffers for
Equipment Self Description (EqSD) to SEMI E125-0414, Specification for Equipment Self Description
(EqSD) |  |
| | | 6837 | | LINE ITEM REVISION TO SEMI E179-0320 SPECIFICATION FOR PROTOCOL BUFFERS COMMON COMPONENTS |  |
| | | 6891 | | LINE ITEM REVISION TO SEMI E125-0414: SPECIFICATION FOR EQUIPMENT SELF DESCRIPTION (EqSD) |  |
| | | 6892 | | LINE ITEM REVISION TO SEMI E179-0320 SPECIFICATION FOR PROTOCOL BUFFERS COMMON COMPONENTS |  |
| | | 6908 | | Revision to Add a New Subordinate Standard: Specification for Protocol Buffers for Common Equipment Model (CEM) to SEMI E120-0414 (Reapproved 0519) Specification For The Common Equipment Model (CEM) |  |
| | | 6927 | | LINE ITEM REVISION TO SEMI E125-XXYY: SPECIFICATION FOR EQUIPMENT SELF DESCRIPTION (EqSD) and SEMI E125.2-WWZZ Specification for Protocol Buffers for Equipment Self Description (EqSD) |  |
| | | 6928 | | LINE ITEM REVISION TO SEMI E132-XXYY SPECIFICATION FOR EQUIPMENT CLIENT AUTHENTICATION AND AUTHORIZATION and SEMI E132.2-WWZZ Specification for Protocol Buffers for Equipment Client Authentication and Authorization (ECA) |  |
| | | 6929 | | LINE ITEM REVISION TO SEMI E134-XXYY Specification for Data Collection Management and SEMI E134.2-WWZZ Specification for Protocol Buffers of Data Collection Management |  |
| | | 6930 | | Revision to SEMI E164-0414 (Reapproved 0721): Specification for EDA Common Metadata |  |
| | | TFOF | | Diagnostic Data Acquisition Task Force NA |  |
| | | | | Reapproval for SEMI E121, Guide for Style and Usage of XML for Semiconductor Manufacturing Applications |  |
|
 | Energy Saving Equipment Communication Task Force |
| |
|
 | Fab & Equipment Computer and Device Security (CDS) Task Force |
| |
|
 | GEM 300 Task Force |
| |
|
 | Graphical User Interfaces (GUI) Task Force |
| |
|
 | NA Information and Control Committee |
| |
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 | Process Control System NA |
| |
|
 | Process Control System NA Task Force |
| |
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 | Sensor Bus Task Force |
| |
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 | Taiwan |
| |
 | Liquid Chemicals |
| |
 | MEMS / NEMS |
| |
 | Metrics |
| |
 | Micropatterning |
| |
 | Photovoltaic |
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 | Photovoltaic (PV) - Materials |
| |
 | Physical Interfaces & Carriers |
| |
 | Silicon Wafer |
| |
 | Traceability |
| |