SEMI International Standards
SEMI New Activity Report Forms (SNARFs)
& SEMI Task Force Organization Forms (TFOFs)
Below you will find the TFOFs of all the task forces actively working in each region. The TFOF contains the charter and purpose of each task force.
The SNARFs that are listed under each task force are the individual activities of the task force. While the majority of these activities lead to the creation or revision of a standard, there are some activities which are focused on exploring and expanding the program.
If you have any further questions on a specific activity, contact your local Standards staff. A listing of global SEMI Standards staff can be found on the contact information page.
Blank forms:
TFOF (DOC 115K) (Feb 2024)
SNARF (DOC 133K) (Apr 2024)
The listing of SNARFs and TFOFs below are sorted by Global Technical Committee, and then by the region that approved the TFOF.
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| 3D Packaging and Integration |
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| Automated Test Equipment |
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| Automation Technology |
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| Compound Semiconductor Materials |
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| EH&S |
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| Facilities |
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| Flat Panel Display (FPD) - Materials & Components |
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| Flat Panel Display (FPD) - Metrology |
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| Flexible Hybrid Electronics (FHE) |
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| FPD - Metrology |
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| Gases |
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| HB-LED |
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| Information & Control |
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| China |
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| Japan |
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| Korea |
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| North America |
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| Advanced Backend Factory Integration |
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| Diagnostic Data Acquisition Task Force NA |
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| Energy Saving Equipment Communication Task Force |
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| Equipment Data Publication (EDP) Task Force |
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| Fab & Equipment Computer and Device Security (CDS) Task Force |
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| GEM 300 Task Force |
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| | | 6835 | | Line Item Revision to SEMI E87-XXXX, Specification for Carrier Management (CMS) and SEMI E87.1-XXXX, Specification for SECS-II Protocol for Carrier Management (CMS) | |
| | | 6836 | | Line Item Revision to SEMI E87-0921, Specification for Carrier Management (CMS) and SEMI E87.1-0921, Specification for SECS-II Protocol for Carrier Management (CMS) and SEMI E90-0921, Specification for Substrate Tracking and E90.1-0312 (Reapproved 0921), Specification for SECS-II Protocol Substrate Tracking | |
| | | 6992 | | Line Item Revision to SEMI E157-0611 (Reapproved 0616), Specification for Module Process Tracking | |
| | | 7064 | | Reapproval of SEMI E40-1218, Specification for Processing Management | |
| | | TFOF | | GEM 300 Task Force | |
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| Graphical User Interfaces (GUI) Task Force |
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| NA Information and Control Committee |
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| Process Control System NA |
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| Sensor Bus Task Force |
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| Taiwan |
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| Liquid Chemicals |
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| MEMS / NEMS |
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| Metrics |
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| Micropatterning |
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| Photovoltaic |
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| Photovoltaic (PV) - Materials |
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| Physical Interfaces & Carriers |
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| Silicon Wafer |
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| Traceability |
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