SEMI International Standards
Standards New Activity Report Form (SNARF)
Date Prepared: 03/15/2016Revised (if Applicable): 06/27/2018

Document Number: 6070
SNARF for: New Standard: Guide for Identifying Cell Defects In Crystalline Silicon PV Modules By Electroluminescence (EL) Imaging

Originating Global Technical Committee: Photovoltaic
Originating TC Chapter: China
Task Force (TF) in which work is to be carried out: PV Module Task Force
Note: If a new task force is needed, also submit a task force organization form (TFOF)

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1. Rationale:
a. Describe the need or problem addressed by this activity.
(Indicate the customer, what benefits they will receive, and if possible, quantify the impact on the return on investment [ROI] if the Document is implemented.)
As one of the most important resource of renewable energy, solar energy has been rapidly deployed in countries all over the world during recent years. To ensure the continuous development of photovoltaic (PV) industry, improving product quality and reducing the product costs are the ultimate goal pursued by manufactures across the PV industry. Most importantly, the quality of the module products is strongly governed by the solar cells. The “hot spot effect” observed in modules can be induced by defects which are invisible to the naked eye and can severely impact conversion efficiency and the service life of products. Therefore, it is very important to accurately test for defects in the solar cells which compose the crystalline silicon PV modules. As we all know, module defects caused by fabrication, transportation and utilization can be found effectively when using proper test methodologies, and are crucial to the process tuning, stable production and quality control during actual production. This standard is formulated in order to develop an accurate and rapid method to analyze the cell defects in crystalline silicon PV modules by using electroluminescence (abbreviation EL).
The document can be a reference for EL inspections through a crystalline silicon photovoltaic modules’ life cycle, which includes manufacturing, shipping, handling, installation, maintenance.
This method is suitable for indoor or fixed single module testing, outdoor module array tests can also use it work as a reference benchmark.
With IEC 60909-13, this document is focus on manufacturing process control, which has been developed and used in 90% of large module manufacturing plants in China, about 80% in all PV companies and has also been recognized and accept by customers and use as a guide in business.



b. Estimate effect on industry.
2: Major effect on an industry sector - identify the relevant sector
Sector or Company Information: Module manufactory, PV System

c. Estimate technical difficulty of the activity.
II: Some Difficulty - Disagreements on known requirements exist but developing consensus is possible

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2. Scope:
a: Describe the technical areas to be covered or addressed by this Document development activity. For Subordinate Standards, list common concepts or criteria that the Subordinate Standard inherits from the Primary Standard, as well as differences from the Primary Standard:
This standard specifies the terms and definitions of the test procedure, test instrument, test environment, sample preparation, image processing, defect types, and test reports to detect the defects of solar cells in the crystalline silicon photovoltaic modules by using an electroluminescent defect detector (referred to as EL detectors or EL inspection equipment).
This standard applies to the test for defects of cells in crystalline silicon photovoltaic modules.
The calculation of the standard aims to characterize EL image types of crystalline silicon photovoltaic modules, including broken cell, micro-crack, finger interruption, black edge, black spot, etc.
The calculation of the standard can be a reference for EL inspections through a crystalline silicon photovoltaic modules’ life cycle, which includes manufacturing, shipping, handling, installation, maintenance and further improvement.


b: Expected result of activity
New Standard or Safety Guideline (including replacement of an existing Standard or Safety Guideline)

For a new Subordinate Standard, identify the Primary Standard here:




For Standards, identify the Standard Subtype below:
Guide

Miscellaneous (describe below):

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3. Projected Timetable for Completion:

a: General Milestones
a. Activity Start: 07/29/2016b. 1st Draft by: 07/29/2016
c. (Optional) Informational Ballot by: d. Letter Ballot by: 11/01/2017
e. TC Chapter Approval By:12/01/2017

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4. Liaisons with other Global Technical Committees/TC Chapters/Subcommittees/TFs:
a.
List global technical committees, TC Chapters, subcommittees, or task forces in your or other Regions/Locales that should be kept informed regarding the progress of this activity. (Refer to SEMI Standards organization charts and global technical committee charters as needed.)


b. Intercommittee Ballots:
will be issued – identify the recipient global technical committee(s):

Identify the recipient global technical committee(s):
Photovoltaic (PV) - Materials
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5. Safety Considerations:
The resulting document is expected:
NOT to be a Safety Guideline

NOTE FOR "to be a Safety Guideline": When all safety-related information is removed from the Document, the Document is NOT technically sound and complete - Refer to Section 15.1 of the Regulations for special procedures to be followed.

NOTE FOR "NOT to be a Safety Guideline": When all safety-related information is removed from the Document, the Document is still technically sound and complete.

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6. Intellectual Property Considerations:
a. For a new Standard or Safety Guideline and for any part to be modified or added in a Revision of published Standards and Safety Guidelines:
the use of patented technology is NOT required.

If "patented technology is intended to be included in the proposed Standard(s) or Safety Guideline(s) " is selected above, then also check one:


b. For Revision, Reapproval, Reinstatement, or Withdrawal of existing Standard(s) and Safety Guideline(s):
there is no known material patented technology necessary to use or implement the Standard(s) and Safety Guideline(s)

c. The body of the Document and any Appendices, Complementary Files, Related Information sections, or Various Materials that may or may not be a part of the Document by reference:



NOTE FORthe use of patented technology or the incorporation of Copyrighted Item(s) is NOT required’: If in the course of developing the Document, it is determined that the use of patented technology or Copyrighted Item(s) is necessary for the Document, the provisions of Regulations § 16 must be followed.

NOTE FORwill incorporate Copyrighted Item’: A copyright release letter must be obtained from the copyright owner prior to publication.

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7. Comments, Special Circumstances:
At the beginning of application approved in 2014, there were 3 standard numbers as topics, specifications, test method and classification, the drafts proposed by the three standards were submitted to the core committee for review at the November 2015 meeting, and then entered the global vote no.5773, 5768,and 5830 entered the ninth global voting in 2015. Ballot feedback suggested that the three contents should be combined for user is the best way to choose, our team discussed and final accept his suggestion the three communications were submitted to the meeting on March 15, 2016. The participating experts unanimously agreed that the three were merged into one, new No. was 6070A.
In the 2017 Global Voting for 6070A, Dr. Peter Vagner suggested and considered the practical guidance of the standard. And we asked for communication IEC staff suggestion and named “6070B” as “Test method identifying cell defects in crystalline silicon PV modules by electroluminescence (EL) imaging”.
“6070B” ,in 2018 Global Voting and Dr. Peter also suggested many professional comments and we communicated with several times, at last our team accept his suggestion, So we decided to change its name as “Guide for Identifying Cell Defects in Crystalline Silicon PV Modules by Electroluminescence (EL) Imaging”, so we followed the “guide “document format requirement to scratch and update some format to express , then discussed with him, he accepted us .So we apply for a new SNARF number once more .


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8. TC Member Review:
took place between (put dates below ) before approval at the TC Chapter Meeting, or

Member Review Start Date; 2016/06/27
Member Review End Date: 2016/07/11

NOTE FOR ‘TC Member Review’ is required by the Regulations for a period of at least two weeks
before approval of a new, or a major revision of an existing, Standard or Safety Guideline. (See Regulations ¶ 8.2.1)
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9. SNARF Approval Dates:
TC Chapter or GCS07/29/2016
Recorded in TC Minutes08/15/2016

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10. SNARF Extension Dates:
TC Chapter Extension Granted on 10/25/2019
Extension Expires on07/29/2020


Attach Pictures and Files here:
SNARF New Standard Test Method for Cell Defects in Crystalline Silicon PV Modules by Electroluminescence (EL) Imaging 2015-6-24.doc
6070B applicatioon for new  SNARF March2015.doc