SEMI International Standards
TASK FORCE ORGANIZATION FORM (TFOF)
Revised (if Applicable):
Name of Task Force (TF):
Wait Time Waste Metrics and Methods (WTW TF)
Global Technical Committee:
Originating Technical Committee Region:
(State the objective of the proposed TF.)
The Wait Time Waste Metrics and Methods (WTW TF) task force seeks to support the creation of SEMI Standards related to measuring, categorizing, and analyzing the time elements in the manufacturing life of production equipment and product units (substrates and lots). The WTW TF may propose such standards, review the work of other task forces (including those from other regions), and/or collaborate with other task forces to create standards.
(Define the specific activities that the TF will conduct.)
The work of the WTW task force shall be limited to time-based metrics of equipment and product units (substrates and lots) in semiconductor manufacturing.
The WTW task force will collaborate with the Japan Cycle Time Metrics Task Force.
The WTW task force initially intends to propose a new specification for equipment time metrics, identifying active time and wait time for the purpose of addressing waste time on the equipment. Future metrics and methods may be developed to address other areas of semiconductor manufacturing, such as AHMS.
The task force will examine related metrics standards such as E10, E79, E58, E116, and E124 before determining the scope and technical content of any proposed standard.
3. Formal linkages with TFs in other Regions/Locales:
(Show each associated TF and its parent global technical committee; indicate nature of relationship – global TF, observer TF, etc.)
Japan Metrics Committee
Japan Cycle Time Metrics Task Force – direct collaboration
Europe - Equipment Automation Committee
Taiwan - TBD
Korea - TBD
4. Formation Date:
(TF formed on)
Task Force formed on:
Task Force approved by Committee/GCS on:
TF was formally known as Product and Equipment Time Metrics (PETM). The leader was:
Bradley Van Eck
Revised to add "(substrates and lots)", "Future metrics and methods may be developed to address other areas of semiconductor manufacturing, such as AHMS" and WTW TF in place of PETM TF.