SEMI International Standards
Date Prepared: 04/02/2019
Revised (if Applicable):

Name of Task Force (TF): Rich Interactive Test Database (RITdb)

Global Technical Committee: Automated Test Equipment
Originating Technical Committee Region: North America

1. Charter: (State the objective of the proposed TF.)
To create a standardized architecture that supports smart adaptive testing for semiconductor makers by providing ready access to integrated, consistent, easy-to-use data across the entire manufacturing and test process.
2. Scope: (Define the specific activities that the TF will conduct.)
The support of Industry 4.0 in semiconductor test requires the inclusion of IOT, M2M, Analytics and Machine learning. RITdb defines a data collection and delivery standard for semiconductor test which leverages worldwide standards in IOT messaging and real time data streaming. Moving away from a people oriented, client server approach to a machine-oriented data cloud requires a change in how test data is defined and distributed. New attributes of quality, trust and security are needed to support this change. The RITdb TF will address these needs by standardizing the data structure, content and distribution while supporting the needs of both legacy and new equipment.
3. Formal linkages with TFs in other Regions/Locales: (Show each associated TF and its parent global technical committee; indicate nature of relationship – global TF, observer TF, etc.)
4. Formation Date:(TF formed on)

Task Force formed on: 04/02/2019
Task Force approved by Committee/GCS on: 04/02/2019