SEMI International Standards
Date Prepared: 12/06/2012
Revised (if Applicable):

Name of Task Force (TF): Japan Test Method Task Force

Global Technical Committee: Silicon Wafer
Originating Technical Committee Region: Japan

1. Charter: (State the objective of the proposed TF.)
The task force has purpose to work on the drafting of international standard document using Japanese. In a concrete action, this task force has relationship between the International Test Method Task Force which will be development of new standard. As the regional activities, it will be performed to survey for future requirement of standardization, other information for new test method for silicon wafers, using questionnaire and so on.
2. Scope: (Define the specific activities that the TF will conduct.)
On basic activity by Japanese, this task force works on the standardization on test method for properties of silicon wafer as any defects, electrically characterization and analysis of any impurities. Also, this task force perform to survey for development of new items as the regional activities.
3. Formal linkages with TFs in other Regions/Locales: (Show each associated TF and its parent global technical committee; indicate nature of relationship – global TF, observer TF, etc.)

Global Silicon Wafer Committee
International Test Methodl Task Force

4. Formation Date:(TF formed on)

Task Force formed on: 12/06/2012
Task Force approved by Committee/GCS on:

The Japan Test Method Task Force has existed since before. However, the TFOF did not exist somehow.