SEMI International Standards
SEMI New Activity Report Form (SNARF)



Activity Number: 5531
SNARF for: Line Item Revision to PV40, Test Method for In-Line Measurement of Saw Marks on PV Silicon Wafers by a Light Sectioning Technique Using Multiple Line Segments


Originating Global Technical Committee: Photovoltaic (PV) - Materials
Originating Technical Committee Region: Europe
Task Force in which work is to be carried out: PV Silicon Materials Task Force


1. Rationale: In PV40 is an error. In 14.3.5.3 and 14.3.5.4 yl,n(x) and yu,n(x) should be interchanged.
Rate the Estimated Effect on the Industry
4: Slight effect or effect not determinable

Rate the Estimated Technical Difficulty of the Activity
I: No Difficulty - Proven concepts and techniques exist or quick agreement anticipated

2. Scope:
a: Define the areas to be covered or addressed by this activity or document:
Exchange yl,n(x) by yu,n(x) and vice versa in 14.3.5.3 and 14.3.5.4

b: Expected result of activity
Revision to an existing Standard/Guideline

3. Projected Timetable for Completion:
a: General Milestones
a. Activity Start: 10/01/2012b. 1st Draft by: 12/01/2012
c. Preballot by: d. Technical Ballot by: 01/01/2013
e. Committee Approval By:03/01/2013




Safety Considerations:
The resulting document is expected NOT to be a Safety Guideline


Intellectual Property Considerations:
a. In complying with the standard or safety guideline to be developed, the use of patented technology or a copyrighted item(s) is NOT required
b. The body of the standard and any appendices or related information sections will NOT include copyrighted material

Comments, Special Circumstances: None.

Approval: Activity approved by Committee/GCS on October 9, 2012