SEMI International Standards
SEMI New Activity Report Form (SNARF)

Activity Number: 5530
SNARF for: New Standard: Specification for Orientation Fiducials for PV Silicon Wafers

Originating Global Technical Committee: Photovoltaic (PV) - Materials
Originating Technical Committee Region: Europe
Task Force in which work is to be carried out: PV Silicon Materials Task Force

1. Rationale: So far geometric wafer parameters, such as thickness, waviness or side lengths, are measured in an arbitrary orientation. This may result in differing measurement results by different parties and may start unnecessary discussions regarding wafer specifications. The new standard will define ways to uniquely orient the wafer during measurement and processing.
Rate the Estimated Effect on the Industry
1: Major effect on entire industry or on multiple important industry sectors

Rate the Estimated Technical Difficulty of the Activity
I: No Difficulty - Proven concepts and techniques exist or quick agreement anticipated

2. Scope:
a: Define the areas to be covered or addressed by this activity or document:
Specify location and type of orientation fiducials for PV Si wafers

b: Expected result of activity
New Standard

3. Projected Timetable for Completion:
a: General Milestones
a. Activity Start: 10/01/2012b. 1st Draft by: 01/01/2013
c. Preballot by: d. Technical Ballot by: 01/01/2013
e. Committee Approval By:03/01/2013

Safety Considerations:
The resulting document is expected NOT to be a Safety Guideline

Intellectual Property Considerations:
a. In complying with the standard or safety guideline to be developed, the use of patented technology or a copyrighted item(s) is NOT required
b. The body of the standard and any appendices or related information sections will NOT include copyrighted material

Comments, Special Circumstances: None.

Approval: Activity approved by Committee/GCS on October 9, 2012