SEMI International Standards
TASK FORCE ORGANIZATION FORM (TFOF)
Date Prepared:
07/11/2018
Revised (if Applicable):
Name of Task Force (TF):
Critical Chamber Components (CCC) Test Methods Task Force
Global Technical Committee:
Metrics
Originating Technical Committee Region:
North America
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1. Charter:
(State the objective of the proposed TF.)
- To ensure the critical chamber components (CCC) are suitable for being used for the type of production equipment and process application they are designed to be used in semiconductor device manufacturing
- To establish Test methods for ensuring that each critical non-process performance related characteristic of CCC is measured, recorded and reported in a uniform manner for better quality assurance and traceability in the event of process failure/defects increase.
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2. Scope:
(Define the specific activities that the TF will conduct.)
- To develop Test Methods for measuring different type of contaminants (e.g., metals, particles, organics) on the wetted area of critical chamber components (CCC).
- To develop Test Methods for measuring surface morphology of CCC
- To develop or expand existing Standards to address Test Methods for refurbished CCC parts.
- May expand other characteristics of CCC as far as such characteristics are in common for across different process equipment types and/or models
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3. Formal linkages with TFs in other Regions/Locales:
(Show each associated TF and its parent global technical committee; indicate nature of relationship – global TF, observer TF, etc.)
None
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4. Formation Date:
(TF formed on)
Task Force formed on:
07/11/2018
Task Force approved by Committee/GCS on:
07/11/2018
5. Comments
None.