SEMI International Standards
Task Force Organization Form (TFOF)
Task Force Name: Impurities and Defects in HB-LED Sapphire Wafers
|Global Technical Committee: HB-LED|
|Originating Technical Committee Region: North America|
Investigate the allowable impurities and defects in HB-LED sapphire wafers.
This Task Force will define and/or measure critical impurities and defects in sapphire wafers and the metrology intended to measure them.
The Task Force will create standards related to these impurities and defects for use by HB-LED sapphire wafer makers and producers of related devices.
Topics to be considered may include, but are not limited to:
1. Bulk Crystal Defects
2. Bulk Crystal Impurities
3. Surface Defects
4. Surface Impurities
3. Formal linkages with Task Forces in other Regions:
Some overlap with members of the Asian and European SEMI Standards groups might occur, as well as NA HB-LED Wafer TF and the NA HB-LED Process Automation TF
Task Force formed on: 10/28/2011
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