SEMI International Standards
Standards Locale: North America
Committee: Metrics
Place of Meeting: Online via Web Conference
Date of Meeting: 02/12/2026
Meeting End Date:
Recording SEMI Standards Staff: Michelle Sun
CER Posted to Web: 02/13/2026
Leadership Changes
None.
TC Chapter Structure Changes
None.
Ballot Results
Document # | Document Title | TC Chapter Action | A&R Forms for Approved Ballots |
| 7436 | Reapproval of SEMI E180-1220 - Test Method for Measuring Surface Metal Contamination Through ICP-MS of Critical Chamber Components Used in Semiconductor Wafer Processing | Failed |  |
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
None.
Authorized Ballots
None.
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
The next meeting is tentatively scheduled for May 14, 2026, from 1:00-3:00 PM Eastern Time. See http://www.semi.org/standards-events for the current list of events.
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