ABOUT
SMART INITIATIVES
MARKET DATA
EVENTS
STANDARDS
STORE
PRESS
SEMI International Standards
New Task Forces and Activities
Below you will find a list of recently created Standards task forces and new activities. Please click on a particular task force or document, for more information.
3D Packaging and Integration Committee
EH&S Committee
Facilities Committee
Flat Panel Display (FPD) - Materials & Components Committee
Flat Panel Display (FPD) - Metrology Committee
Gases Committee
Information & Control Committee
Liquid Chemicals Committee
MEMS / NEMS Committee
SNARF
Doc 7516 - Reapproval of SEMI MS04-0416 (Reapproved 0522), Test Method for Young's Modulus Measurements of Thin, Reflecting Films Based on the Frequency of Beams in Resonance
SNARF
Doc 7517 - Reapproval of SEMI MS08-0309 (Reapproved 0622), Guide to Evaluating Hermeticity of Microelectromechanical Systems (MEMS) Packages
SNARF
Doc 7518 - Reapproval of SEMI MS14-0422, Guide for Critical Parameters of Gas Sensors
Physical Interfaces & Carriers Committee
Silicon Wafer Committee
Traceability Committee
If you have any questions concerning a specifc task force or document, please
contact a SEMI Standards staff
nearest you.
Back to SEMI Standards Committee Info
Copyright ©2026 Semiconductor Equipment and Materials International (SEMI®). All rights reserved.