SEMI International Standards
SEMI New Activity Report Forms (SNARFs)
& SEMI Task Force Organization Forms (TFOFs)

Below you will find the TFOFs of all the task forces actively working in each region. The TFOF contains the charter and purpose of each task force.

The SNARFs that are listed under each task force are the individual activities of the task force. While the majority of these activities lead to the creation or revision of a standard, there are some activities which are focused on exploring and expanding the program.

If you have any further questions on a specific activity, contact your local Standards staff. A listing of global SEMI Standards staff can be found on the contact information page.

Blank forms：
TFOF (DOC 115K) (Sept 2024)
SNARF (DOC 133K) (April 2026)

The listing of SNARFs and TFOFs below are sorted by Global Technical Committee, and then by the region that approved the TFOF.

Navigation Tips:
1. Click on the "twistie" to view the items under each heading.
2. To use the display navigator bar, click on:
EXPAND - to expand all sections
COLLAPSE - to collapse all sections.

Expand | Collapse

Show details for 3D Packaging and Integration3D Packaging and Integration
Show details for Automated Test EquipmentAutomated Test Equipment
Show details for Automation TechnologyAutomation Technology
Show details for Compound Semiconductor MaterialsCompound Semiconductor Materials
Show details for EH&SEH&S
Show details for FacilitiesFacilities
Show details for Flat Panel Display (FPD) - Materials & ComponentsFlat Panel Display (FPD) - Materials & Components
Show details for Flat Panel Display (FPD) - MetrologyFlat Panel Display (FPD) - Metrology
Show details for Flexible Hybrid Electronics (FHE)Flexible Hybrid Electronics (FHE)
Show details for GasesGases
Show details for HB-LEDHB-LED
Show details for Information & ControlInformation & Control
Hide details for Liquid ChemicalsLiquid Chemicals
Show details for EuropeEurope
Show details for JapanJapan
Hide details for North AmericaNorth America
Hide details for Chemical Analytical Methods Task ForceChemical Analytical Methods Task Force
7146Revision to SEMI C41-0618, Specification and Guide for 2-Propanol
7148Revision to SEMI C62-0309 (Reapproved 0618), Specification for Porogen Precursors Used in Low K CVD Processes, with title change to: Specification for Porogen Precursors (Alpha-Terpinene, Limonene, Bicycloheptadiene, & Cyclooctane) Used in Low K CVD Processes
7149Revision to SEMI C63-1108 (Reapproved 0618), Specification for Organosilicate Precursors Used in Low K CVD Processes
7471Revision to SEMI C98-1219, Guide for Chemical Mechanical Planarization (CMP) Particle Size Distribution (PSD) Measurement and Reporting Used in Semiconductor Manufacturing
TFOFChemical Analytical Methods Task Force
Revision to SEMI C96-1121, Test Method for Determining Density of Chemical Mechanical Planarization (CMP) Slurries
Show details for Chemical Mechanical Planarization Consumables (CMP-C) Task ForceChemical Mechanical Planarization Consumables (CMP-C) Task Force
Show details for High Purity Liquid Assemblies & Systems Task ForceHigh Purity Liquid Assemblies & Systems Task Force
Show details for High Purity Polymer Materials and Components Task ForceHigh Purity Polymer Materials and Components Task Force
Show details for Liquid Chemicals CommitteeLiquid Chemicals Committee
Show details for Statistical Methods Task ForceStatistical Methods Task Force
Show details for Ultra Pure Water Task ForceUltra Pure Water Task Force
Show details for Water Management Task ForceWater Management Task Force
Show details for MEMS / NEMSMEMS / NEMS
Show details for MetricsMetrics
Show details for MicropatterningMicropatterning
Show details for PhotovoltaicPhotovoltaic
Show details for Photovoltaic (PV) - MaterialsPhotovoltaic (PV) - Materials
Show details for Physical Interfaces & CarriersPhysical Interfaces & Carriers
Show details for Silicon WaferSilicon Wafer
Show details for TraceabilityTraceability

Expand | Collapse