SEMI International Standards
SEMI New Activity Report Forms (SNARFs)
& SEMI Task Force Organization Forms (TFOFs)
Below you will find the TFOFs of all the task forces actively working in each region. The TFOF contains the charter and purpose of each task force.
The SNARFs that are listed under each task force are the individual activities of the task force. While the majority of these activities lead to the creation or revision of a standard, there are some activities which are focused on exploring and expanding the program.
If you have any further questions on a specific activity, contact your local Standards staff. A listing of global SEMI Standards staff can be found on the contact information page.
Blank forms:
TFOF (DOC 115K) (Sept 2024)
SNARF (DOC 133K) (April 2026)
The listing of SNARFs and TFOFs below are sorted by Global Technical Committee, and then by the region that approved the TFOF.
Navigation Tips:
1. Click on the "twistie"
to view the items under each heading.
2. To use the display navigator bar, click on:
EXPAND - to expand all sections
COLLAPSE - to collapse all sections.
Expand | Collapse
 |  |  | | | |
 | 3D Packaging and Integration |
| |
 | Automated Test Equipment |
| |
 | Automation Technology |
| |
 | Compound Semiconductor Materials |
| |
 | EH&S |
| |
 | Facilities |
| |
 | Flat Panel Display (FPD) - Materials & Components |
| |
 | Flat Panel Display (FPD) - Metrology |
| |
 | Flexible Hybrid Electronics (FHE) |
| |
 | Gases |
| |
 | HB-LED |
| |
 | Information & Control |
| |
 | Liquid Chemicals |
| |
|
|
 | Europe |
| |
|
|
 | Japan |
| |
|
|
 | North America |
| |
|
|
 | Chemical Analytical Methods Task Force |
| |
|
|
 | Chemical Mechanical Planarization Consumables (CMP-C) Task Force |
| |
|
|
 | High Purity Liquid Assemblies & Systems Task Force |
| |
|
|
 | High Purity Polymer Materials and Components Task Force |
| |
| | | 6601 | New Standard: Guide for Meeting IRDS Yield Table Recommendations for High Purity Polymer Materials and Components Used in Ultrapure Water |  |
| | | 7089 | Line-Item Revision to SEMI C78-0113 (Reapproved 1218), Test Method for Determining Roughness of Polymer Surfaces Used in Ultrapure Water and Liquid Chemical Distribution Systems by Atomic Force Microscopy |  |
| | | 7353 | Revision to SEMI F104-0520, Test Method for Evaluation of Particle Contribution of Components Used in Ultrapure Water and Liquid Chemical Distribution Systems, with title change to: Specification for Particle Contribution of Components Used in Ultrapure Water and Liquid Chemical Distribution Systems |  |
| | | 7390 | Revision to SEMI C78-0113 (Reapproved 1218) Test Method for Determining Roughness of Polymer Surfaces Used in Ultrapure Water and Liquid Chemical Distribution Systems by Atomic Force Microscopy, with change of Title to:
Test Method for Determining, By Atomic Force Microscopy, Roughness of Polymer Surfaces Used in Ultrapure Water and Liquid Chemical Distribution Systems |  |
| | | TFOF | High Purity Polymer Materials and Components Task Force |  |
|
|
 | Liquid Chemicals Committee |
| |
|
|
 | Statistical Methods Task Force |
| |
|
|
 | Ultra Pure Water Task Force |
| |
|
|
 | Water Management Task Force |
| |
 | MEMS / NEMS |
| |
 | Metrics |
| |
 | Micropatterning |
| |
 | Photovoltaic |
| |
 | Photovoltaic (PV) - Materials |
| |
 | Physical Interfaces & Carriers |
| |
 | Silicon Wafer |
| |
 | Traceability |
| |
Expand | Collapse
Copyright ©2026 Semiconductor Equipment and Materials International (SEMI®). All rights reserved.