SEMI International Standards
New Task Forces and Activities


Below you will find a list of recently created Standards task forces and new activities. Please click on a particular task force or document, for more information.

Hide details for 3D Packaging and Integration Committee3D Packaging and Integration Committee
SNARF Doc 7460 - Line Item Revision to SEMI G82-1115, SPECIFICATION FOR 300 mm LOAD PORT FOR FRAME CASSETTES IN BACKEND PROCESS
SNARF Doc 7461 - Line Item Revision to G95-1120, SPECIFICATION FOR MECHANICAL FEATURES OF 450 mm LOAD PORT FOR TAPE FRAME CASSETTES IN THE BACKEND PROCESS
SNARF Doc 7462 - Line Item Revision of SEMI G74-0699 (Reapproved 1020), SPECIFICATION FOR TAPE FRAME FOR 300 mm WAFERS
SNARF Doc 7463 - Line Item Revision to G87-1108 (Reapproved 1020), SPECIFICATION FOR PLASTIC TAPE FRAME FOR 300 mm WAFER
SNARF Doc 7464 - New Standard: Guide for Using Pressure Measurement Film for Wafer Surface Pressure Mapping in Equipment Alignment Processes
SNARF Doc 7466 - New Standard: Guide for Shear Testing of RDLs and Other Traces Used within Advanced Packages and Structures
Hide details for Automation Technology CommitteeAutomation Technology Committee
SNARF Doc 7477 - Line Item Revision to SEMI A5-0525 SPECIFICATION FOR FACTORY OPERATION EXTENSION FOR SEMI A2 SMASH (SMASH-FOX)
Hide details for EH&S CommitteeEH&S Committee
SNARF Doc 7469 - Line item Revision SEMI S2-0724E Environmental, Health, and Safety Guideline for Semiconductor Manufacturing Equipment
SNARF Doc 7470 - Revision of SEMI S5, Safety Guideline for Sizing and Identifying Flow Limiting Devices for Gases
TFOF Flow Limitting Devices Task Force
TFOF Robot Safety Task Force
TFOF S2 Airborne Chemicals Task Force
Hide details for Facilities CommitteeFacilities Committee
SNARF Doc 7473 - Line-Item Revision to SEMI F122-0225, Guide for Facilities Data Package for Manufacturing Equipment Installation and Building Information Modeling
Hide details for Flat Panel Display (FPD) - Metrology CommitteeFlat Panel Display (FPD) - Metrology Committee
SNARF Doc 7474 - New Standard, Test Method for See-through Image Quality based on Image-based CW-SSIM Index and Contrast-Refined-Optical Structural Score
Hide details for Information & Control CommitteeInformation & Control Committee
SNARF Doc 7456 - Revision to Add a New Subordinate Standard: Specification for Common Data for Deposition Components to Specification for Equipment Data Publication
SNARF Doc 7457 - Revision to Add a New Subordinate Standard: Specification for Common Data for Ion Implant Components to Specification for Equipment Data Publication
SNARF Doc 7465 - New Standard: Specification for Digital Twins in Manufacturing
SNARF Doc 7475 - Line Item Revision to E90-1224, SPECIFICATION FOR SUBSTRATE TRACKING and E90.1-1224, SPECIFICATION FOR SECS-II PROTOCOL SUBSTRATE TRACKING
SNARF Doc 7476 - New Standard: GUIDE FOR MAINTENANCE ROBOT COMMUNICATIONS
TFOF Diagnostic Data Acquisition Task Force
Hide details for Liquid Chemicals CommitteeLiquid Chemicals Committee
SNARF Doc 7467 - New Auxiliary Information Document Comparing and Contrasting SEMI C79, C82 and C89
SNARF Doc 7471 - Revision to SEMI C98-1219, Guide for Chemical Mechanical Planarization (CMP) Particle Size Distribution (PSD) Measurement and Reporting Used in Semiconductor Manufacturing
SNARF Doc 7472 - New Auxiliary Information Document: Evolution of Paths for Waste in Semiconductor Manufacturing
Hide details for Physical Interfaces & Carriers CommitteePhysical Interfaces & Carriers Committee
SNARF Doc 7453 - New Standard: Specification for 310mm Square Panel FOUP
SNARF Doc 7454 - Line Item Revision to SEMI E100-1104 (Reapproved 0710) SPECIFICATION FOR A RETICLE SMIF POD (RSP) USED TO TRANSPORT AND STORE 6 INCH OR 230 mm RETICLES
SNARF Doc 7455 - Line Item Revision to E182.3 - Specification for Panel FOUP load port with ground based delivery exclusion volume
Hide details for Silicon Wafer CommitteeSilicon Wafer Committee
SNARF Doc 7468 - Revision to SEMI M95-0925, TEST METHOD FOR NET CARRIER DENSITY AND RESISTIVITY OF SILICON EPITAXIAL LAYER BY CAPACITANCE-VOLTAGE MEASUREMENTS WITH AN EVAPORATED METAL SCHOTTKY DIODE


If you have any questions concerning a specifc task force or document, please contact a SEMI Standards staff nearest you.