 | | | | | | | |
|---|
 | 3D Packaging and Integration Committee |
| |
| SNARF | | | | | Doc 7466 - New Standard: Guide for Shear Testing of RDLs and Other Traces Used within Advanced Packages and Structures | |
| TFOF | | | | | 310 mm Square Panel Glass Carrier Task Force | |
| Automation Technology Committee |
| |
| SNARF | | | | | Doc 7477 - Line Item Revision to SEMI A5-0525 SPECIFICATION FOR FACTORY OPERATION EXTENSION FOR SEMI A2 SMASH (SMASH-FOX) | |
| EH&S Committee |
| |
| SNARF | | | | | Doc 7469 - Line item Revision SEMI S2-0724E Environmental, Health, and Safety Guideline for Semiconductor Manufacturing Equipment | |
| SNARF | | | | | Doc 7470 - Revision of SEMI S5, Safety Guideline for Sizing and Identifying Flow Limiting Devices for Gases | |
| TFOF | | | | | Flow Limitting Devices Task Force | |
| TFOF | | | | | S2 Airborne Chemicals Task Force | |
| Facilities Committee |
| |
| SNARF | | | | | Doc 7473 - Line-Item Revision to SEMI F122-0225, Guide for Facilities Data Package for Manufacturing Equipment Installation and Building Information Modeling | |
| SNARF | | | | | Doc 7479 - Reapproval of SEMI F1-0521, Specification for Leak Integrity of High-Purity Gas Piping Systems and Components | |
| SNARF | | | | | Doc 7481 - Line Item Revision to SEMI F44-0325, Specification for Machined Stainless Steel Weld Fittings | |
| Flat Panel Display (FPD) - Metrology Committee |
| |
| SNARF | | | | | Doc 7474 - New Standard, Test Method for See-through Image Quality based on Image-based CW-SSIM Index and Contrast-Refined-Optical Structural Score | |
| Information & Control Committee |
| |
| SNARF | | | | | Doc 7465 - New Standard: Specification for Digital Twins in Manufacturing | |
| SNARF | | | | | Doc 7475 - Line Item Revision to E90-1224, SPECIFICATION FOR SUBSTRATE TRACKING and E90.1-1224, SPECIFICATION FOR SECS-II PROTOCOL SUBSTRATE TRACKING | |
| SNARF | | | | | Doc 7476 - New Standard: GUIDE FOR MAINTENANCE ROBOT COMMUNICATIONS | |
| SNARF | | | | | Doc 7480 - New Standard: Specification for Equipment Edge Data Integration | |
| TFOF | | | | | Diagnostic Data Acquisition Task Force | |
| Liquid Chemicals Committee |
| |
| SNARF | | | | | Doc 7467 - New Auxiliary Information Document Comparing and Contrasting SEMI C79, C82 and C89 | |
| SNARF | | | | | Doc 7471 - Revision to SEMI C98-1219, Guide for Chemical Mechanical Planarization (CMP) Particle Size Distribution (PSD) Measurement and Reporting Used in Semiconductor Manufacturing | |
| SNARF | | | | | Doc 7472 - New Auxiliary Information Document: Evolution of Paths for Waste in Semiconductor Manufacturing | |
| SNARF | | | | | Doc 7482 - New Auxiliary Information: Report on Closing Metrologies Gaps for post-CMP Brushes | |
| Physical Interfaces & Carriers Committee |
| |
| SNARF | | | | | Doc 7483 - New Standard: Specification for Process Cell Anchoring | |
| SNARF | | | | | Doc 7484 - New Standard: Specification for Mainframe Garage and Process Cell Envelope Dimensions | |
| Silicon Wafer Committee |
| |
| SNARF | | | | | Doc 7468 - Revision to SEMI M95-0925, TEST METHOD FOR NET CARRIER DENSITY AND RESISTIVITY OF SILICON EPITAXIAL LAYER BY CAPACITANCE-VOLTAGE MEASUREMENTS WITH AN EVAPORATED METAL SCHOTTKY DIODE | |