SEMI International Standards
Committee Express Reports by Committee

Committee Express Reports (CERs) are summaries of the most recent committee meetings and provide detail of major actions that occurred. These are usually available within two weeks after the committee meeting. To access the full minutes of the technical committee, please go to the Technical Committee Minutes page.


To view CERs by Event, click Here.

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Hide details for 3DS-IC3DS-IC
Hide details for JapanJapan
04/15/2016Japan Spring Meetings
02/05/2016Japan Winter Meetings
Hide details for North AmericaNorth America
04/05/2016NA Spring Meetings
Hide details for Assembly & PackagingAssembly & Packaging
Hide details for JapanJapan
02/05/2016Japan Winter Meetings
Hide details for Automation TechnologyAutomation Technology
Hide details for JapanJapan
04/22/2016Japan Spring Meetings
01/19/2016Japan Winter Meetings
Hide details for China PV Standards CommitteeChina PV Standards Committee
Hide details for ChinaChina
03/15/2016China Spring Standards Meeting 2016
Hide details for Compound Semiconductor MaterialsCompound Semiconductor Materials
Hide details for EuropeEurope
04/12/2016Europe Spring Meetings
Hide details for North AmericaNorth America
05/18/2016Off-venue Committee Meeting
Hide details for EHSEHS
Hide details for JapanJapan
04/19/2016Japan Spring Meetings
12/18/2015SEMICON Japan
Hide details for North AmericaNorth America
04/07/2016NA Spring Meetings
Hide details for TaiwanTaiwan
03/23/2016Taiwan Spring Meetings
Hide details for FacilitiesFacilities
Hide details for JapanJapan
03/16/2016Japan Spring Meetings
12/15/2015SEMICON Japan
Hide details for Facilities & GasesFacilities & Gases
Hide details for North AmericaNorth America
04/05/2016NA Spring Meetings
Hide details for Flat Panel Display (FPD) - Materials & ComponentsFlat Panel Display (FPD) - Materials & Components
Hide details for JapanJapan
04/06/2016Japan Spring Meetings
02/05/2016Japan Winter Meetings
Hide details for Flat Panel Display (FPD) - MetrologyFlat Panel Display (FPD) - Metrology
Hide details for JapanJapan
04/06/2016Japan Spring Meetings
Hide details for GasesGases
Hide details for JapanJapan
03/18/2016Japan Spring Meetings
12/15/2015SEMICON Japan
Hide details for HB-LEDHB-LED
Hide details for ChinaChina
04/21/2016China Spring Meetings
Hide details for North AmericaNorth America
04/07/2016NA Spring Meetings
Hide details for Information & ControlInformation & Control
Hide details for JapanJapan
03/08/2016Japan Spring Meetings
12/18/2015SEMICON Japan
Hide details for KoreaKorea
04/29/2016Korea Spring Meetings
01/28/2016SEMICON Korea
Hide details for North AmericaNorth America
04/13/2016NA Spring Meetings
Hide details for TaiwanTaiwan
04/08/2016Taiwan Spring Meetings
Hide details for Liquid ChemicalsLiquid Chemicals
Hide details for JapanJapan
12/16/2015SEMICON Japan
Hide details for North AmericaNorth America
04/05/2016NA Spring Meetings
Hide details for MEMS / NEMSMEMS / NEMS
Hide details for North AmericaNorth America
04/04/2016NA Spring Meetings
Hide details for MetricsMetrics
Hide details for North AmericaNorth America
04/06/2016NA Spring Meetings
Hide details for MicrolithographyMicrolithography
Hide details for North AmericaNorth America
02/24/2016NA SPIE Microlithography Meetings
Hide details for MicropatterningMicropatterning
Hide details for JapanJapan
05/12/2016Japan Summer Meetings
01/28/2016Japan Winter Meetings
Hide details for PhotovoltaicPhotovoltaic
Hide details for ChinaChina
03/15/2016China Spring Meetings
Hide details for JapanJapan
04/18/2016Japan Spring Meetings
Hide details for TaiwanTaiwan
01/22/2016Off-venue Committee Meeting
Hide details for Photovoltaic (PV) - MaterialsPhotovoltaic (PV) - Materials
Hide details for JapanJapan
04/18/2016Japan Spring Meetings
Hide details for North AmericaNorth America
04/06/2016NA Spring Meetings
Hide details for Physical Interfaces & CarriersPhysical Interfaces & Carriers
Hide details for JapanJapan
04/14/2016Japan Spring Meetings
12/16/2015SEMICON Japan
Hide details for North AmericaNorth America
04/06/2016NA Spring Meetings
Hide details for Silicon WaferSilicon Wafer
Hide details for JapanJapan
03/11/2016Japan Spring Meetings
12/17/2015SEMICON Japan
Hide details for North AmericaNorth America
04/05/2016NA Spring Meetings
Hide details for TraceabilityTraceability
Hide details for JapanJapan
12/18/2015SEMICON Japan

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