SEMI International Standards
Committee Express Reports by Committee

Committee Express Reports (CERs) are summaries of the most recent committee meetings and provide detail of major actions that occurred. These are usually available within two weeks after the committee meeting. To access the full minutes of the technical committee, please go to the Technical Committee Minutes page.


To view CERs by Event, click Here.

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Hide details for 3DS-IC3DS-IC
Hide details for North AmericaNorth America
07/14/2015SEMICON West
03/31/2015NA Spring Meetings
Hide details for Automation TechnologyAutomation Technology
Hide details for JapanJapan
06/24/2015Japan Summer Meetings
04/09/2015Japan Spring Meetings
Hide details for Compound Semiconductor MaterialsCompound Semiconductor Materials
Hide details for EuropeEurope
04/15/2015Europe Spring Meetings
Hide details for North AmericaNorth America
05/20/2015CS MANTECH Compound Meetings
Hide details for EHSEHS
Hide details for JapanJapan
06/05/2015Japan Summer Meetings
04/17/2015Japan Spring Meetings
Hide details for North AmericaNorth America
07/16/2015SEMICON West
04/02/2015NA Spring Meetings
Hide details for FacilitiesFacilities
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04/24/2015Japan Spring Meetings
Hide details for North AmericaNorth America
07/14/2015SEMICON West
03/31/2015NA Spring Meetings
Hide details for Flat Panel Display (FPD) - Materials & ComponentsFlat Panel Display (FPD) - Materials & Components
Hide details for JapanJapan
04/10/2015Japan Spring Meetings
02/06/2015Japan Winter Meetings
Hide details for Flat Panel Display (FPD) - MetrologyFlat Panel Display (FPD) - Metrology
Hide details for JapanJapan
04/10/2015Japan Spring Meetings
Hide details for KoreaKorea
02/06/2015SEMICON Korea
Hide details for GasesGases
Hide details for JapanJapan
04/24/2015Japan Spring Meetings
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07/14/2015SEMICON West
03/31/2015NA Spring Meetings
Hide details for HB-LEDHB-LED
Hide details for ChinaChina
04/10/2015China Spring Meetings
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07/16/2015SEMICON West
04/02/2015NA Spring Meetings
Hide details for Information & ControlInformation & Control
Hide details for JapanJapan
06/30/2015Japan Summer Meetings
04/23/2015Japan Spring Meetings
Hide details for KoreaKorea
06/19/2015Korea Summer Meetings
02/05/2015SEMICON Korea
Hide details for North AmericaNorth America
07/15/2015SEMICON West
04/01/2015NA Spring Meetings
Hide details for Liquid ChemicalsLiquid Chemicals
Hide details for North AmericaNorth America
07/14/2015SEMICON West
03/31/2015NA Spring Meetings
Hide details for MEMS / NEMSMEMS / NEMS
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07/13/2015SEMICON West
03/30/2015NA Spring Meetings
Hide details for MetricsMetrics
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07/15/2015SEMICON West
04/01/2015NA Spring Meetings
Hide details for MicrolithographyMicrolithography
Hide details for North AmericaNorth America
07/14/2015SEMICON West
Hide details for MicropatterningMicropatterning
Hide details for JapanJapan
02/05/2015Japan Winter Meetings
Hide details for PackagingPackaging
Hide details for JapanJapan
05/11/2015Japan Spring Meetings
Hide details for PhotovoltaicPhotovoltaic
Hide details for ChinaChina
03/17/2015China Summer Meetings
Hide details for Photovoltaic (PV) - MaterialsPhotovoltaic (PV) - Materials
Hide details for EuropeEurope
06/11/2015Intersolar Europe
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07/15/2015SEMICON West
04/01/2015NA Spring Meetings
Hide details for Physical Interfaces & CarriersPhysical Interfaces & Carriers
Hide details for JapanJapan
04/15/2015Japan Spring Meetings
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07/15/2015SEMICON West
04/01/2015NA Spring Meetings
Hide details for Silicon WaferSilicon Wafer
Hide details for JapanJapan
06/12/2015Japan Summer Meetings
03/06/2015Japan Spring Meetings
Hide details for North AmericaNorth America
07/14/2015SEMICON West
03/31/2015NA Spring Meetings
Hide details for TraceabilityTraceability
Hide details for North AmericaNorth America
07/13/2015SEMICON West

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