SEMI International Standards
New Task Forces and Activities


Below you will find a list of recently created Standards task forces and new activities. Please click on a particular task force or document, for more information.

Show details for 3D Packaging and Integration Committee3D Packaging and Integration Committee
Show details for EH&S CommitteeEH&S Committee
Show details for Facilities CommitteeFacilities Committee
Show details for Flat Panel Display (FPD) - Materials & Components CommitteeFlat Panel Display (FPD) - Materials & Components Committee
Show details for Flat Panel Display (FPD) - Metrology CommitteeFlat Panel Display (FPD) - Metrology Committee
Show details for Gases CommitteeGases Committee
Hide details for Information & Control CommitteeInformation & Control Committee
SNARF Doc 7478 - Revision to SEMI E95-1101: Specification for Human Interface for Semiconductor Manufacturing Equipment and Revision to Add a New Subordinate Standard: Specification on Communicating Safety Information in Human Interfaces to SEMI E095-1011: Specification for Human Interface for Semiconductor Manufacturing Equipment
SNARF Doc 7487 - Line Item Revision to SEMI E190-1124 – Specification for Equipment Data Publication (EDP)
SNARF Doc 7488 - Line-Item Revision to
SEMI E120-1225 Specification for the Common Equipment Model (CEM),
SEMI E120.2-1225 Specification for Protocol Buffers for Common Equipment Model (CEM),
SEMI E125-1225 Specification for Equipment Self Description (EqSD),
SEMI E125.2-1225 Specification for Protocol Buffers for Equipment Self Description (EqSD),
SEMI E132-1225 Specification for Equipment Client Authentication and Authorization,
SEMI E132.2-1225 Specification for Protocol Buffers for Equipment Client Authentication and Authorization (ECA),
SEMI E134-1225 Specification for Data Collection Management,
SEMI E134.2-1225 Specification for Protocol Buffers of Data Collection Management, and
SEMI E179-1225 Specification for Protocol Buffers Common Components
SNARF Doc 7489 - Line Item Revision to E5-0725, Specification for SEMI Equipment Communications Standard 2 Message Content (SECS-II), E30-0725, Specification for the Generic Model for Communications and Control of Manufacturing Equipment (GEM)
SNARF Doc 7491 - Line Item Revision to SEMI E40-0226: Specification for Processing Management and SEMI E40.1-0226: Specification for SECS-II Protocol for Processing Management
SNARF Doc 7492 - Line Item Revision to SEMI E94-0226 - Specification for Control Job Management and SEMI E94.1-0226 — Specification for SECS-II Protocol for Control Job Management (CJM)
SNARF Doc 7493 - Line Item Revision to SEMI E87-0225: Specification for Carrier Management (CMS), SEMI E87.1-0225: Specification for SECS-II Protocol for Carrier Management (CMS), SEMI E172-0725: SEMI E172 - Specification for SECS Equipment Data Dictionary (SEDD)
SNARF Doc 7494 - Withdrawal of SEMI E188-0222 - Specification for Malware Free Equipment Integration
SNARF Doc 7523 - Revision to SEMI E54.11-0316 (Reapproved 0721): Specification for Sensor/Actuator Network Specific Device Model for Endpoint Devices
SNARF Doc 7524 - Revision to SEMI E54.3-0698 (Reapproved 0721): Specification for Sensor/Actuator Network Specific Device Model for Mass Flow Device
SNARF Doc 7525 - Line-Item Revision to
SEMI E120-1225 Specification for the Common Equipment Model (CEM),
SEMI E120.2-1225 Specification for Protocol Buffers for Common Equipment Model (CEM),
SEMI E125-1225 Specification for Equipment Self Description (EqSD),
SEMI E125.2-1225 Specification for Protocol Buffers for Equipment Self Description (EqSD),
SEMI E132-1225 Specification for Equipment Client Authentication and Authorization,
SEMI E132.2-1225 Specification for Protocol Buffers for Equipment Client Authentication and Authorization (ECA),
SEMI E134-1225 Specification for Data Collection Management,
SEMI E134.2-1225 Specification for Protocol Buffers of Data Collection Management, and
SEMI E179-1225 Specification for Protocol Buffers Common Components
SNARF Doc 7526 - Line Item Revision to
SEMI E142.0-0225: Specification for Substrate Mapping
SEMI E142.1-0225: Specification for XML Schema for Substrate Mapping
SEMI E142.2-1016 (0225): Specification for SECS II Protocol for Substrate Mapping
SEMI E142.3-1016 (0225):  Specification for Web Services for Substrate Mapping
SEMI E142.4-1022 (0225): Specification for SECS II Protocol for Substrate Mapping Using Item Transfer
Show details for Liquid Chemicals CommitteeLiquid Chemicals Committee
Show details for MEMS / NEMS CommitteeMEMS / NEMS Committee
Show details for Metrics CommitteeMetrics Committee
Show details for Physical Interfaces & Carriers CommitteePhysical Interfaces & Carriers Committee
Show details for Silicon Wafer CommitteeSilicon Wafer Committee
Show details for Traceability CommitteeTraceability Committee


If you have any questions concerning a specifc task force or document, please contact a SEMI Standards staff nearest you.