SEMI International Standards
New Task Forces and Activities


Below you will find a list of recently created Standards task forces and new activities. Please click on a particular task force or document, for more information.

Show details for 3D Packaging and Integration Committee3D Packaging and Integration Committee
Show details for EH&S CommitteeEH&S Committee
Show details for Flat Panel Display (FPD) - Metrology CommitteeFlat Panel Display (FPD) - Metrology Committee
Show details for Information & Control CommitteeInformation & Control Committee
Show details for Liquid Chemicals CommitteeLiquid Chemicals Committee
Show details for Physical Interfaces & Carriers CommitteePhysical Interfaces & Carriers Committee
Hide details for Silicon Wafer CommitteeSilicon Wafer Committee
SNARF Doc 7496 - Line-item revision to SEMI M90-0821: Test Method for Bulk Micro Defect Density and Denuded Zone Width in Annealed Silicon Wafers by Optical Microscopy After Preferential Etching
SNARF Doc 7502 - Line Item Revision of SEMI M67-0720 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Thickness Data Array Using the ESFQR, ESFQD, and ESBIR Metrics
SNARF Doc 7503 - Line Item Revision of SEMI M68-0720 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Height Data Array Using a Curvature Metric, ZDD
Show details for Traceability CommitteeTraceability Committee


If you have any questions concerning a specifc task force or document, please contact a SEMI Standards staff nearest you.